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dc.contributor.authorCowan, Ray Franklin
dc.contributor.authorDujmic, Denis
dc.contributor.authorSciolla, Gabriella
dc.date.accessioned2012-09-24T15:06:10Z
dc.date.available2012-09-24T15:06:10Z
dc.date.issued2012-03
dc.date.submitted2011-11
dc.identifier.issn1550-7998
dc.identifier.issn1089-4918
dc.identifier.urihttp://hdl.handle.net/1721.1/73117
dc.description.abstractWe present the first results on the Dalitz-plot structure and improved measurements of the time-dependent CP-violation parameters of the process B[superscript 0]→KS[superscript 0]KS[superscript 0]KS[superscript 0] obtained using 468×10[superscript 6]  BB̅ decays collected with the BABAR detector at the PEP-II asymmetric-energy B factory at SLAC. The Dalitz-plot structure is probed by a time-integrated amplitude analysis that does not distinguish between B[superscript 0] and B̅[superscript 0] decays. We measure the total inclusive branching fraction B(B[superscript 0]-->KS[superscript 0]KS[superscript 0]KS[superscript]0)=(6.19±0.48±0.15±0.12)×10-6, where the first uncertainty is statistical, the second is systematic, and the third represents the Dalitz-plot signal model dependence. We also observe evidence for the intermediate resonant states f0(980), f0(1710), and f2(2010). Their respective product branching fractions are measured to be (2.70[subscript -1.19][superscript +1.25]±0.36±1.17)×10[superscript -6], (0.50[subscript -0.24][superscript +0.46]±0.04±0.10)×10[superscript -6], and (0.54[subscript -0.20][superscript +0.21]±0.03±0.52)×10[superscript -6]. Additionally, we determine the mixing-induced CP-violation parameters to be S=-0.94[subscript -0.21][superscript +0.24]±0.06 and C=-0.17±0.18±0.04, where the first uncertainty is statistical and the second is systematic. These values are in agreement with the standard model expectation. For the first time, we report evidence of CP violation in B[superscript 0]-->KS[superscript 0]KS[superscript 0]KS[superscript 0] decays; CP conservation is excluded at 3.8 standard deviations including systematic uncertainties.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevD.85.054023en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleAmplitude Analysis and Measurement of the Time-dependent CP Asymmetry of B[superscript 0]-->K[subscript S][superscript 0]K[subscript S][superscript 0]K[subscript S][superscript 0] Decaysen_US
dc.title.alternativeAmplitude analysis and measurement of the time-dependent CP asymmetry of B0→KS0KS0KS0 decaysen_US
dc.typeArticleen_US
dc.identifier.citationLees, J. et al. “Amplitude analysis and measurement of the time-dependent CP asymmetry of B0→KS0KS0KS0 decays.” Physical Review D 85.5 (2012): 054023-1-054023-21. © 2012 American Physical Society.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.approverSciolla, Gabriella
dc.contributor.mitauthorCowan, Ray Franklin
dc.contributor.mitauthorDujmic, Denis
dc.contributor.mitauthorSciolla, Gabriella
dc.relation.journalPhysical Review Den_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLees, J.; Poireau, V.; Tisserand, V.; Garra Tico, J.; Grauges, E.; Martinelli, M.; Milanes, D.; Palano, A.; Pappagallo, M.; Eigen, G.; Stugu, B.; Brown, D.; Kerth, L.; Kolomensky, Yu.; Lynch, G.; Koch, H.; Schroeder, T.; Asgeirsson, D.; Hearty, C.; Mattison, T.; McKenna, J.; Khan, A.; Blinov, V.; Buzykaev, A.; Druzhinin, V.; Golubev, V.; Kravchenko, E.; Onuchin, A.; Serednyakov, S.; Skovpen, Yu.; Solodov, E.; Todyshev, K.; Yushkov, A.; Bondioli, M.; Kirkby, D.; Lankford, A.; Mandelkern, M.; Stoker, D.; Atmacan, H.; Gary, J.; Liu, F.; Long, O.; Vitug, G.; Campagnari, C.; Hong, T.; Kovalskyi, D.; Richman, J.; West, C.; Eisner, A.; Kroseberg, J.; Lockman, W.; Martinez, A.; Schalk, T.; Schumm, B.; Seiden, A.; Cheng, C.; Doll, D.; Echenard, B.; Flood, K.; Hitlin, D.; Ongmongkolkul, P.; Porter, F.; Rakitin, A.; Andreassen, R.; Dubrovin, M.; Huard, Z.; Meadows, B.; Sokoloff, M.; Sun, L.; Bloom, P.; Ford, W.; Gaz, A.; Nagel, M.; Nauenberg, U.; Smith, J.; Wagner, S.; Ayad, R.; Toki, W.; Spaan, B.; Kobel, M.; Schubert, K.; Schwierz, R.; Bernard, D.; Verderi, M.; Clark, P.; Playfer, S.; Bettoni, D.; Bozzi, C.; Calabrese, R.; Cibinetto, G.; Fioravanti, E.; Garzia, I.; Luppi, E.; Munerato, M.; Negrini, M.; Piemontese, L.; Santoro, V.; Baldini-Ferroli, R.; Calcaterra, A.; de Sangro, R.; Finocchiaro, G.; Nicolaci, M.; Patteri, P.; Peruzzi, I.; Piccolo, M.; Rama, M.; Zallo, A.; Contri, R.; Guido, E.; Lo Vetere, M.; Monge, M.; Passaggio, S.; Patrignani, C.; Robutti, E.; Bhuyan, B.; Prasad, V.; Lee, C.; Morii, M.; Edwards, A.; Adametz, A.; Marks, J.; Uwer, U.; Bernlochner, F.; Ebert, M.; Lacker, H.; Lueck, T.; Dauncey, P.; Tibbetts, M.; Behera, P.; Mallik, U.; Chen, C.; Cochran, J.; Meyer, W.; Prell, S.; Rosenberg, E.; Rubin, A.; Gritsan, A.; Guo, Z.; Arnaud, N.; Davier, M.; Grosdidier, G.; Le Diberder, F.; Lutz, A.; Malaescu, B.; Roudeau, P.; Schune, M.; Stocchi, A.; Wormser, G.; Lange, D.; Wright, D.; Bingham, I.; Chavez, C.; Coleman, J.; Fry, J.; Gabathuler, E.; Hutchcroft, D.; Payne, D.; Touramanis, C.; Bevan, A.; Di Lodovico, F.; Sacco, R.; Sigamani, M.; Cowan, G.; Brown, D.; Davis, C.; Denig, A.; Fritsch, M.; Gradl, W.; Hafner, A.; Prencipe, E.; Alwyn, K.; Bailey, D.; Barlow, R.; Jackson, G.; Lafferty, G.; Behn, E.; Cenci, R.; Hamilton, B.; Jawahery, A.; Roberts, D.; Simi, G.; Dallapiccola, C.; Cowan, R.; Dujmic, D.; Sciolla, G.; Lindemann, D.; Patel, P.; Robertson, S.; Schram, M.; Biassoni, P.; Lazzaro, A.; Lombardo, V.; Neri, N.; Palombo, F.; Stracka, S.; Cremaldi, L.; Godang, R.; Kroeger, R.; Sonnek, P.; Summers, D.; Nguyen, X.; Taras, P.; De Nardo, G.; Monorchio, D.; Onorato, G.; Sciacca, C.; Raven, G.; Snoek, H.; Jessop, C.; Knoepfel, K.; LoSecco, J.; Wang, W.; Honscheid, K.; Kass, R.; Brau, J.; Frey, R.; Sinev, N.; Strom, D.; Torrence, E.; Feltresi, E.; Gagliardi, N.; Margoni, M.; Morandin, M.; Posocco, M.; Rotondo, M.; Simonetto, F.; Stroili, R.; Akar, S.; Ben-Haim, E.; Bomben, M.; Bonneaud, G.; Briand, H.; Calderini, G.; Chauveau, J.; Hamon, O.; Leruste, Ph.; Marchiori, G.; Ocariz, J.; Sitt, S.; Biasini, M.; Manoni, E.; Pacetti, S.; Rossi, A.; Angelini, C.; Batignani, G.; Bettarini, S.; Carpinelli, M.; Casarosa, G.; Cervelli, A.; Forti, F.; Giorgi, M.; Lusiani, A.; Oberhof, B.; Paoloni, E.; Perez, A.; Rizzo, G.; Walsh, J.; Lopes Pegna, D.; Lu, C.; Olsen, J.; Smith, A.; Telnov, A.; Anulli, F.; Cavoto, G.; Faccini, R.; Ferrarotto, F.; Ferroni, F.; Li Gioi, L.; Mazzoni, M.; Piredda, G.; Bünger, C.; Grünberg, O.; Hartmann, T.; Leddig, T.; Schröder, H.; Waldi, R.; Adye, T.; Olaiya, E.; Wilson, F.; Emery, S.; Hamel de Monchenault, G.; Vasseur, G.; Yèche, Ch.; Aston, D.; Bard, D.; Bartoldus, R.; Cartaro, C.; Convery, M.; Dorfan, J.; Dubois-Felsmann, G.; Dunwoodie, W.; Field, R.; Franco Sevilla, M.; Fulsom, B.; Gabareen, A.; Graham, M.; Grenier, P.; Hast, C.; Innes, W.; Kelsey, M.; Kim, H.; Kim, P.; Kocian, M.; Leith, D.; Lewis, P.; Li, S.; Lindquist, B.; Luitz, S.; Luth, V.; Lynch, H.; MacFarlane, D.; Muller, D.; Neal, H.; Nelson, S.; Ofte, I.; Perl, M.; Pulliam, T.; Ratcliff, B.; Roodman, A.; Salnikov, A.; Schindler, R.; Snyder, A.; Su, D.; Sullivan, M.; Va’vra, J.; Wagner, A.; Weaver, M.; Wisniewski, W.; Wittgen, M.; Wright, D.; Wulsin, H.; Yarritu, A.; Young, C.; Ziegler, V.; Park, W.; Purohit, M.; White, R.; Wilson, J.; Randle-Conde, A.; Sekula, S.; Bellis, M.; Benitez, J.; Burchat, P.; Miyashita, T.; Alam, M.; Ernst, J.; Gorodeisky, R.; Guttman, N.; Peimer, D.; Soffer, A.; Lund, P.; Spanier, S.; Eckmann, R.; Ritchie, J.; Ruland, A.; Schilling, C.; Schwitters, R.; Wray, B.; Izen, J.; Lou, X.; Bianchi, F.; Gamba, D.; Lanceri, L.; Vitale, L.; Martinez-Vidal, F.; Oyanguren, A.; Ahmed, H.; Albert, J.; Banerjee, Sw.; Choi, H.; King, G.; Kowalewski, R.; Lewczuk, M.; Nugent, I.; Roney, J.; Sobie, R.; Tasneem, N.; Gershon, T.; Harrison, P.; Latham, T.; Puccio, E.; Band, H.; Dasu, S.; Pan, Y.; Prepost, R.; Wu, S.en
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