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dc.contributor.authorde Bock, H. Peter J.
dc.contributor.authorChauhan, Shakti
dc.contributor.authorChamarthy, Pramod
dc.contributor.authorWeaver, Stanton E.
dc.contributor.authorDeng, Tao
dc.contributor.authorGerner, Frank M.
dc.contributor.authorAbabneh, Mohammed T.
dc.contributor.authorVaranasi, Kripa K.
dc.date.accessioned2012-09-25T12:47:53Z
dc.date.available2012-09-25T12:47:53Z
dc.date.issued2010-07
dc.date.submitted2010-06
dc.identifier.isbn978-1-4244-5343-6
dc.identifier.isbn978-1-4244-5342-9
dc.identifier.issn1087-9870
dc.identifier.urihttp://hdl.handle.net/1721.1/73149
dc.description.abstractAs power densities in electronic devices have increased dramatically over the last decade, advanced thermal management solutions are required. A significant part of the thermal resistance budget is commonly taken up by the heat spreader, which serves to reduce the input heat flux and connect to an increased area for heat removal. Thermal ground planes are devices that address this issue by utilizing two-phase heat transfer achieving higher effective thermal conductivities than conventional solid heat spreaders. This study describes the need for and design of a charging station to accurately dispense the working fluid and a thermal characterization experiment to characterize performance. The design study includes detailed analysis of accuracy and validation of the setup.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (SSC SD Contract N66001-08-C-2008)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ITHERM.2010.5501325en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleOn the charging and thermal characterization of a micro/nano structured thermal ground planeen_US
dc.typeArticleen_US
dc.identifier.citationde Bock, H. Peter J. et al. “On the Charging and Thermal Characterization of a Micro/nano Structured Thermal Ground Plane.” 12th IEEE Intersociety Conference onThermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010. 1–6. © Copyright 2010 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorVaranasi, Kripa K.
dc.relation.journalProceedings of the 12th IEEE Intersociety Conference onThermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsde Bock, H. Peter J.; Chauhan, Shakti; Chamarthy, Pramod; Weaver, Stanton E.; Deng, Tao; Gerner, Frank M.; Ababneh, Mohammed T.; Varanasi, Kripaen
dc.identifier.orcidhttps://orcid.org/0000-0002-6846-152X
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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