| dc.contributor.author | Palacios, Tomas | |
| dc.contributor.author | Killat, Nicole | |
| dc.contributor.author | Tapajna, Milan | |
| dc.contributor.author | Faqir, Mustapha | |
| dc.contributor.author | Kuball, Martin | |
| dc.date.accessioned | 2012-10-01T19:07:52Z | |
| dc.date.available | 2012-10-01T19:07:52Z | |
| dc.date.issued | 2011-03 | |
| dc.identifier.issn | 0013-5194 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/73526 | |
| dc.description.abstract | Electroluminescence (EL) spectroscopy in combination with drift-diffusion simulations was used to prove the presence of impact ionisation in AlGaN/GaN HEMTs illustrated on InGaN back-barrier devices. Regardless of the level of gate leakage current, which is dominated by contributions such as surface leakage current and others, EL enabled the revealing of hole generation due to impact ionisation. Hole currents as low as 10pA were detectable by the optical technique used. | en_US |
| dc.description.sponsorship | United States. Office of Naval Research Global (N00014-08-1-1091) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institution of Electrical Engineers (IEE) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1049/el.2010.7540 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike 3.0 | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/ | en_US |
| dc.source | Other University Web Domain | en_US |
| dc.title | Evidence for impact ionisation in AlGaN/GaN HEMTs with InGaN back-barrier | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Killat, N. et al. “Evidence for Impact Ionisation in AlGaN/GaN HEMTs with InGaN Back-barrier.” Electronics Letters 47.6 (2011): 405. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.mitauthor | Palacios, Tomas | |
| dc.relation.journal | Electronics Letters | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Killat, N.; Ťapajna, M.; Faqir, M.; Palacios, T.; Kuball, M. | en |
| dc.identifier.orcid | https://orcid.org/0000-0002-2190-563X | |
| mit.license | OPEN_ACCESS_POLICY | en_US |
| mit.metadata.status | Complete | |
