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dc.contributor.authorTan, Vincent Yan Fu
dc.contributor.authorJohnson, Matthew James
dc.contributor.authorWillsky, Alan S.
dc.date.accessioned2012-10-04T13:32:45Z
dc.date.available2012-10-04T13:32:45Z
dc.date.issued2010-07
dc.date.submitted2010-06
dc.identifier.isbn978-1-4244-7891-0
dc.identifier.isbn978-1-4244-7890-3
dc.identifier.urihttp://hdl.handle.net/1721.1/73588
dc.description.abstractWe consider recovering the salient feature subset for distinguishing between two probability models from i.i.d. samples. Identifying the salient set improves discrimination performance and reduces complexity. The focus in this work is on the high-dimensional regime where the number of variables d, the number of salient variables k and the number of samples n all grow. The definition of saliency is motivated by error exponents in a binary hypothesis test and is stated in terms of relative entropies. It is shown that if n grows faster than max{ck log((d-k)/k), exp(c'k)} for constants c, c', then the error probability in selecting the salient set can be made arbitrarily small. Thus, n can be much smaller than d. The exponential rate of decay and converse theorems are also provided. An efficient and consistent algorithm is proposed when the distributions are graphical models which are Markov on trees.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ISIT.2010.5513598en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleNecessary and sufficient conditions for high-dimensional salient feature subset recoveryen_US
dc.typeArticleen_US
dc.identifier.citationTan, Vincent Y. F., Matthew Johnson, and Alan S. Willsky. “Necessary and Sufficient Conditions for High-dimensional Salient Feature Subset Recovery.” IEEE International Symposium on Information Theory Proceedings (ISIT), 2010. 1388–1392. ©2010 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Information and Decision Systemsen_US
dc.contributor.mitauthorTan, Vincent Yan Fu
dc.contributor.mitauthorJohnson, Matthew James
dc.contributor.mitauthorWillsky, Alan S.
dc.relation.journalProceedings of the IEEE International Symposium on Information Theory Proceedings (ISIT), 2010en_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dspace.orderedauthorsTan, Vincent Y. F.; Johnson, Matthew; Willsky, Alan S.en
dc.identifier.orcidhttps://orcid.org/0000-0003-0149-5888
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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