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dc.contributor.authorTan, Vincent Yan Fu
dc.contributor.authorSanghavi, Sujay
dc.contributor.authorFisher, John W., III
dc.contributor.authorWillsky, Alan S.
dc.date.accessioned2012-10-04T16:50:38Z
dc.date.available2012-10-04T16:50:38Z
dc.date.issued2010-07
dc.date.submitted2010-02
dc.identifier.issn1053-587X
dc.identifier.issn1941-0476
dc.identifier.urihttp://hdl.handle.net/1721.1/73608
dc.description.abstractSparse graphical models have proven to be a flexible class of multivariate probability models for approximating high-dimensional distributions. In this paper, we propose techniques to exploit this modeling ability for binary classification by discriminatively learning such models from labeled training data, i.e., using both positive and negative samples to optimize for the structures of the two models. We motivate why it is difficult to adapt existing generative methods, and propose an alternative method consisting of two parts. First, we develop a novel method to learn tree-structured graphical models which optimizes an approximation of the log-likelihood ratio. We also formulate a joint objective to learn a nested sequence of optimal forests-structured models. Second, we construct a classifier by using ideas from boosting to learn a set of discriminative trees. The final classifier can interpreted as a likelihood ratio test between two models with a larger set of pairwise features. We use cross-validation to determine the optimal number of edges in the final model. The algorithm presented in this paper also provides a method to identify a subset of the edges that are most salient for discrimination. Experiments show that the proposed procedure outperforms generative methods such as Tree Augmented Naïve Bayes and Chow-Liu as well as their boosted counterparts.en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research (Grant FA9550-08-1-1080)en_US
dc.description.sponsorshipUnited States. Army Research Office. Multidisciplinary University Research Initiative (Grant W911NF-06-1-0076)en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research. Multidisciplinary University Research Initiative (Grant FA9550-06-1-0324)en_US
dc.description.sponsorshipSingapore. Agency for Science, Technology and Researchen_US
dc.description.sponsorshipUnited States. Air Force Research Laboratory (Award No. FA8650-07-D-1220)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TSP.2010.2059019en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleLearning graphical models for hypothesis testing and classificationen_US
dc.typeArticleen_US
dc.identifier.citationTan, Vincent Y. F. et al. “Learning Graphical Models for Hypothesis Testing and Classification.” IEEE Transactions on Signal Processing 58.11 (2010): 5481–5495. © Copyright 2010 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Information and Decision Systemsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Stochastic Systems Groupen_US
dc.contributor.mitauthorTan, Vincent Yan Fu
dc.contributor.mitauthorFisher, John W., III
dc.contributor.mitauthorWillsky, Alan S.
dc.relation.journalIEEE Transactions on Signal Processingen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsTan, Vincent Y. F.; Sanghavi, Sujay; Fisher, John W.; Willsky, Alan S.en
dc.identifier.orcidhttps://orcid.org/0000-0003-4844-3495
dc.identifier.orcidhttps://orcid.org/0000-0003-0149-5888
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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