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dc.contributor.authordel Alamo, Jesus A.
dc.contributor.authorKim, Dae-Hyun
dc.contributor.authorKim, Tae-Woo
dc.contributor.authorJin, Donghyun
dc.contributor.authorAntoniadis, Dimitri A.
dc.date.accessioned2012-10-16T13:41:36Z
dc.date.available2012-10-16T13:41:36Z
dc.date.issued2011-08
dc.date.submitted2011-05
dc.identifier.isbn978-3-8007-3356-9
dc.identifier.isbn978-1-4577-1753-6
dc.identifier.urihttp://hdl.handle.net/1721.1/74008
dc.description.abstractThe ability of Si CMOS to continue to scale down transistor size while delivering enhanced logic performance has recently come into question. An end to Moore's Law threatens to bring to a halt the microelectronics revolution: a historical 50 year run of exponential progress in the power of electronics that has profoundly transformed human society. The outstanding transport properties of certain III-V compound semiconductors make these materials attractive to address this problem. This paper outlines the case for III-V CMOS, harvests lessons from recent research on III-V High Electron Mobility Transistors (HEMTs) and summarizes some of the key challenges in front of a future III-V logic technology.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=5978379&contentType=Conference+Publications&searchField%3DSearch_All%26queryText%3DIII-V+CMOS%3A+What+have+we+learned+from+HEMTs%3Fen_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleIII-V CMOS: What have we learned from HEMTs?en_US
dc.typeArticleen_US
dc.identifier.citationJesús A. del Alamo et al. "III-V CMOS: What have we learned from HEMTs?" 2011 and 23rd International Conference on Indium Phosphide and Related Materials Compound Semiconductor Week (CSW/IPRM), (May 2011).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.mitauthordel Alamo, Jesus A.
dc.contributor.mitauthorKim, Dae-Hyun
dc.contributor.mitauthorKim, Tae-Woo
dc.contributor.mitauthorJin, Donghyun
dc.contributor.mitauthorAntoniadis, Dimitri A.
dc.relation.journalProceedings on the 2011 and 23rd International Conference on Indium Phosphide and Related Materials Compound Semiconductor Week (CSW/IPRM)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-4836-6525
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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