dc.contributor.author | Peterson, Randolph S. | |
dc.contributor.author | Berggren, Karl K. | |
dc.contributor.author | Mondol, Mark K. | |
dc.date.accessioned | 2012-10-19T13:35:39Z | |
dc.date.available | 2012-10-19T13:35:39Z | |
dc.date.issued | 2010-08 | |
dc.identifier.issn | 0094-243X | |
dc.identifier.issn | 1551-7616 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/74142 | |
dc.description.abstract | Few universities or colleges have an accelerator for use with advanced physics laboratories, but many of these institutions have a scanning electron microscope (SEM) on site, often in the biology department. As an accelerator for the undergraduate, advanced physics laboratory, the SEM is an excellent substitute for an ion accelerator. Although there are no nuclear physics experiments that can be performed with a typical 30 kV SEM, there is an opportunity for experimental work on accelerator physics, atomic physics, electron‐solid interactions, and the basics of modern e‐beam lithography. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Grant 0823778) | en_US |
dc.language.iso | en_US | |
dc.publisher | American Institute of Physics (AIP) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1063/1.3586204 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike 3.0 | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/ | en_US |
dc.source | MIT web domain | en_US |
dc.title | The scanning electron microscope as an accelerator for the undergraduate advanced physics laboratory | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Peterson, Randolph S. et al. “The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory.” AIP Conference Proceedings v. 1336, 753–757, 2011. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
dc.contributor.mitauthor | Peterson, Randolph S. | |
dc.contributor.mitauthor | Berggren, Karl K. | |
dc.contributor.mitauthor | Mondol, Mark K. | |
dc.relation.journal | AIP Conference Proceedings | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Peterson, Randolph S.; Berggren, Karl K.; Mondol, Mark; McDaniel, Floyd D.; Doyle, Barney L. | en |
dc.identifier.orcid | https://orcid.org/0000-0002-3031-4890 | |
dc.identifier.orcid | https://orcid.org/0000-0001-7453-9031 | |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |