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dc.contributor.authorLee, Jongho
dc.contributor.authorRahman, Faizur
dc.contributor.authorLaoui, Tahar
dc.contributor.authorKarnik, Rohit
dc.date.accessioned2012-10-22T13:35:50Z
dc.date.available2012-10-22T13:35:50Z
dc.date.issued2012-08
dc.date.submitted2012-01
dc.identifier.issn1539-3755
dc.identifier.issn1550-2376
dc.identifier.urihttp://hdl.handle.net/1721.1/74169
dc.description.abstractBubble damping in displacement-driven microfluidic flows was theoretically and experimentally investigated for a Y-channel microfluidic network. The system was found to exhibit linear behavior for typical microfluidic flow conditions. The bubbles induced a low-pass filter behavior with a characteristic cutoff frequency that scaled proportionally with flow rate and inversely with bubble volume and exhibited a minimum with respect to the relative resistances of the connecting channels. A theoretical model based on the electrical circuit analogy was able to predict experimentally observed damping of fluctuations with excellent agreement. Finally, a flowmeter with high resolution (0.01 μL/min) was demonstrated as an application of the bubble-aided stabilization. This study may aid in the design of many other bubble-stabilized microfluidic systems.en_US
dc.description.sponsorshipKing Fahd University of Petroleum and Minerals (Project R10-CW-09)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevE.86.026301en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleBubble-induced damping in displacement-driven microfluidic flowsen_US
dc.typeArticleen_US
dc.identifier.citationLee, Jongho et al. “Bubble-induced Damping in Displacement-driven Microfluidic Flows.” Physical Review E 86.2 (2012). ©2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorLee, Jongho
dc.contributor.mitauthorKarnik, Rohit
dc.relation.journalPhysical Review Een_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLee, Jongho; Rahman, Faizur; Laoui, Tahar; Karnik, Rohiten
dc.identifier.orcidhttps://orcid.org/0000-0003-0588-9286
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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