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Superconducting microfabricated ion traps

dc.contributor.authorGe, Yufei
dc.contributor.authorLabaziewicz, Jaroslaw
dc.contributor.authorDauler, Eric A.
dc.contributor.authorChuang, Isaac L.
dc.contributor.authorWang, Shannon X.
dc.contributor.authorBerggren, Karl K
dc.date.accessioned2012-11-26T20:00:12Z
dc.date.available2012-11-26T20:00:12Z
dc.date.issued2010-12
dc.date.submitted2010-10
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/75027
dc.descriptionWang, Shannon X. et al. “Superconducting Microfabricated Ion Traps.” Applied Physics Letters 97.24 (2010): 244102. © 2010 American Institute of Physicsen_US
dc.description.abstractWe fabricate superconducting ion traps with niobium and niobium nitride and trap single [superscript 88]Sr ions at cryogenic temperatures. The superconducting transition is verified and characterized by measuring the resistance and critical current using a four-wire measurement on the trap structure, and observing change in the rf reflection. The lowest observed heating rate is 2.1(3) quanta/s at 800 kHz at 6 K and shows no significant change across the superconducting transition, suggesting that anomalous heating is primarily caused by noise sources on the surface. This demonstration of superconducting ion traps opens up possibilities for integrating trapped ions and molecular ions with superconducting devices.en_US
dc.description.sponsorshipUnited States. Intelligence Advanced Research Projects Activityen_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency. Quantum Entanglement Science and Technologyen_US
dc.description.sponsorshipUnited States. Army Research Office. Comprehensive Materials and Morphologies Study of Ion Trapsen_US
dc.description.sponsorshipMIT-Harvard Center for Ultracold Atomsen_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3526733en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.titleSuperconducting microfabricated ion trapsen_US
dc.typeArticleen_US
dc.identifier.citationWang, Shannon X. et al. “Superconducting Microfabricated Ion Traps.” Applied Physics Letters 97.24 (2010): 244102. © 2010 American Institute of Physicsen_US
dc.contributor.departmentLincoln Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.departmentMIT-Harvard Center for Ultracold Atomsen_US
dc.contributor.mitauthorWang, Shannon Xuanyue
dc.contributor.mitauthorGe, Yufei
dc.contributor.mitauthorLabaziewicz, Jaroslaw
dc.contributor.mitauthorDauler, Eric A.
dc.contributor.mitauthorBerggren, Karl K.
dc.contributor.mitauthorChuang, Isaac L.
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsWang, Shannon X.; Ge, Yufei; Labaziewicz, Jaroslaw; Dauler, Eric; Berggren, Karl; Chuang, Isaac L.en
dc.identifier.orcidhttps://orcid.org/0000-0001-7296-523X
dc.identifier.orcidhttps://orcid.org/0000-0001-7453-9031
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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