Show simple item record

dc.contributor.authorWu, Leon
dc.contributor.authorTeravainen, Timothy
dc.contributor.authorKaiser, Gail
dc.contributor.authorAnderson, Roger
dc.contributor.authorBoulanger, Albert
dc.contributor.authorRudin, Cynthia
dc.date.accessioned2012-12-11T17:06:34Z
dc.date.available2012-12-11T17:06:34Z
dc.date.issued2011-07
dc.identifier.isbn1457707756
dc.identifier.isbn9781457707759
dc.identifier.isbn978-1-4577-0777-3
dc.identifier.otherINSPEC Accession Number: 12110277
dc.identifier.urihttp://hdl.handle.net/1721.1/75392
dc.description.abstractAn important problem in reliability engineering is to predict the failure rate, that is, the frequency with which an engineered system or component fails. This paper presents a new method of estimating failure rate using a semiparametric model with Gaussian process smoothing. The method is able to provide accurate estimation based on historical data and it does not make strong a priori assumptions of failure rate pattern (e.g., constant or monotonic). Our experiments of applying this method in power system failure data compared with other models show its efficacy and accuracy. This method can be used in estimating reliability for many other systems, such as software systems or components.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/EnergyTech.2011.5948537en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT web domainen_US
dc.titleEstimation of system reliability using a semiparametric modelen_US
dc.typeArticleen_US
dc.identifier.citationWu, Leon et al. “Estimation of System Reliability Using a Semiparametric Model.” EnergyTech, 2011 IEEE, 25-26 May 2011, Case Western Reserve University, IEEE, 2011. 1–6. Web.en_US
dc.contributor.departmentSloan School of Managementen_US
dc.contributor.mitauthorRudin, Cynthia
dc.relation.journalEnergyTech, 2011 IEEEen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsWu, Leon; Teravainen, Timothy; Kaiser, Gail; Anderson, Roger; Boulanger, Albert; Rudin, Cynthiaen
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record