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dc.contributor.authorShapiro, Jeffrey H.
dc.contributor.authorZerom, Petros
dc.contributor.authorShi, Zhimin
dc.contributor.authorO’Sullivan, Malcolm N.
dc.contributor.authorChan, Kam Wai Clifford
dc.contributor.authorKrogstad, Molly
dc.contributor.authorBoyd, Robert W.
dc.date.accessioned2013-02-13T17:52:35Z
dc.date.available2013-02-13T17:52:35Z
dc.date.issued2012-12
dc.date.submitted2012-06
dc.identifier.issn1050-2947
dc.identifier.issn1094-1622
dc.identifier.urihttp://hdl.handle.net/1721.1/76801
dc.description.abstractWe present theoretical and experimental results showing that a thermal ghost imaging system can produce images of high quality even when it uses detectors so slow that they respond only to intensity-averaged (that is, “blurred”) speckle patterns, as long as the collected signal variation is predominantly caused by the random fluctuation of the incident speckle field rather than other noise sources. In our experimental study, we show that the quality of the ghost image is not degraded when as many as 25 speckle patterns are averaged together for each measurement. This surprising result comes from the fact that the averaging of speckle patterns leads to a decrease in the contrast but not in the kurtosis, and the image quality of a ghost imaging system is dependent on the kurtosis rather than the contrast ratio of the illuminating field. These results suggest that a broad class of imaging systems based on the use of speckle techniques can be implemented even using detectors that respond slowly on the time scale of the fluctuating speckle pattern.en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevA.86.063817en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleThermal ghost imaging with averaged speckle patternsen_US
dc.typeArticleen_US
dc.identifier.citationZerom, Petros et al. “Thermal Ghost Imaging with Averaged Speckle Patterns.” Physical Review A 86.6 (2012). © 2012 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorShapiro, Jeffrey H.
dc.relation.journalPhysical Review Aen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsZerom, Petros; Shi, Zhimin; O'Sullivan, Malcolm N.; Chan, Kam Wai Clifford; Krogstad, Molly; Shapiro, Jeffrey H.; Boyd, Robert W.en
dc.identifier.orcidhttps://orcid.org/0000-0002-6094-5861
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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