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dc.contributor.authorJohnson, Jeremiah A.
dc.contributor.authorMaznev, Alexei
dc.contributor.authorEliason, Jeffrey Kristian
dc.contributor.authorNelson, Keith Adam
dc.contributor.authorCuffe, John
dc.contributor.authorMinnich, Austin Jerome
dc.contributor.authorKehoe, Timothy
dc.contributor.authorTorres, Clivia M. Sotomayor
dc.contributor.authorChen, Gang
dc.date.accessioned2013-02-20T20:50:45Z
dc.date.available2013-02-20T20:50:45Z
dc.date.issued2013-01
dc.date.submitted2012-04
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/77165
dc.description.abstractThe “textbook” phonon mean free path of heat carrying phonons in silicon at room temperature is ∼40  nm. However, a large contribution to the thermal conductivity comes from low-frequency phonons with much longer mean free paths. We present a simple experiment demonstrating that room-temperature thermal transport in Si significantly deviates from the diffusion model already at micron distances. Absorption of crossed laser pulses in a freestanding silicon membrane sets up a sinusoidal temperature profile that is monitored via diffraction of a probe laser beam. By changing the period of the thermal grating we vary the heat transport distance within the range ∼1–10  μm. At small distances, we observe a reduction in the effective thermal conductivity indicating a transition from the diffusive to the ballistic transport regime for the low-frequency part of the phonon spectrum.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Science (Award DE-SC0001299)en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Science (Award DE-FG02-09ER46577)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.110.025901en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleDirect Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membraneen_US
dc.typeArticleen_US
dc.identifier.citationJohnson, Jeremy A. et al. “Direct Measurement of Room-Temperature Nondiffusive Thermal Transport Over Micron Distances in a Silicon Membrane.” Physical Review Letters 110.2 (2013). © 2013 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorJohnson, Jeremiah A.
dc.contributor.mitauthorMaznev, Alexei
dc.contributor.mitauthorEliason, Jeffrey Kristian
dc.contributor.mitauthorNelson, Keith Adam
dc.contributor.mitauthorMinnich, Austin Jerome
dc.contributor.mitauthorChen, Gang
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsJohnson, Jeremy A.; Maznev, A. A.; Cuffe, John; Eliason, Jeffrey K.; Minnich, Austin J.; Kehoe, Timothy; Torres, Clivia M. Sotomayor; Chen, Gang; Nelson, Keith A.en
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
dc.identifier.orcidhttps://orcid.org/0000-0001-9157-6491
dspace.mitauthor.errortrue
mit.licensePUBLISHER_POLICYen_US


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