| dc.contributor.author | Zhao, Fu-Yun | |
| dc.contributor.author | Liu, Di | |
| dc.contributor.author | Yim, Hung Lam Steve | |
| dc.date.accessioned | 2013-03-12T18:54:58Z | |
| dc.date.available | 2013-03-12T18:54:58Z | |
| dc.date.issued | 2012 | |
| dc.date.submitted | 2012-11 | |
| dc.identifier.issn | 1110-757X | |
| dc.identifier.issn | 1687-0042 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/77634 | |
| dc.description.abstract | Efficiency, security, and reliability of industrial and domestic processes essentially depend on the deep understanding of their actual processes of fluid flow and heat transfer. Actual processes of fluid flow control and measurements need the development of effect-cause inverse modeling. Extensive investigations on the effect-cause inverse modeling could effectively enhance the efficiency, security, and reliability of these industrial and domestic fluid flow processes. | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Hindawi Publishing Corporation | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1155/2012/850260 | en_US |
| dc.rights | Creative Commons Attribution | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by/2.0 | en_US |
| dc.title | Inverse Fluid Convection Problems in Enclosures | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Zhao, Fu-Yun, Di Liu, and Steve H. L. Yim. “Inverse Fluid Convection Problems in Enclosures.” Journal of Applied Mathematics 2012 (2012): 1–2. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics | en_US |
| dc.contributor.mitauthor | Yim, Hung Lam Steve | |
| dc.relation.journal | Journal of Applied Mathematics | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Zhao, Fu-Yun; Liu, Di; Yim, Steve H. L. | en |
| mit.license | PUBLISHER_CC | en_US |
| mit.metadata.status | Complete | |