MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

High-Order Regularized Regression in Electrical Impedance Tomography

Author(s)
Polydorides, Nick; Adhasi, Alireza; Miller, Eric L.
Thumbnail
DownloadPolydorides-2012-High-Order Regularized Regression in Electrical Impedance Tomography.pdf (1.253Mb)
PUBLISHER_POLICY

Publisher Policy

Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.

Terms of use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Metadata
Show full item record
Abstract
We present a novel approach for the inverse problem in electrical impedance tomography based on regularized quadratic regression. Our contribution introduces a new formulation for the forward model in the form of a nonlinear integral transform, which maps changes in the electrical properties of a domain to their respective variations in boundary data. Using perturbation theory the transform is approximated to yield a high-order misfit function which is then used to derive a regularized inverse problem. In particular, we consider the nonlinear problem to second-order accuracy; hence our approximation method improves upon the local linearization of the forward mapping. The inverse problem is approached using Newton's iterative algorithm, and results from simulated experiments are presented. With a moderate increase in computational complexity, the method yields superior results compared to those of regularized linear regression and can be implemented to address the nonlinear inverse problem.
Date issued
2012-08
URI
http://hdl.handle.net/1721.1/77895
Department
MIT Energy Initiative
Journal
SIAM Journal on Imaging Sciences
Publisher
Society for Industrial and Applied Mathematics
Citation
Polydorides, Nick, Alireza Aghasi, and Eric L. Miller. “High-Order Regularized Regression in Electrical Impedance Tomography.” SIAM Journal on Imaging Sciences 5.3 (2012): 912–943. CrossRef. Web. © 2012, Society for Industrial and Applied Mathematics.
Version: Final published version
ISSN
1936-4954

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.