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dc.contributor.authorSullivan, Joseph Timothy
dc.contributor.authorBuonassisi, Tonio
dc.contributor.authorSaid, Aurore J.
dc.contributor.authorRecht, Daniel
dc.contributor.authorWarrender, Jeffrey M.
dc.contributor.authorPersans, Peter D.
dc.contributor.authorAziz, Michael J.
dc.date.accessioned2013-03-28T15:45:05Z
dc.date.available2013-03-28T15:45:05Z
dc.date.issued2011-08
dc.date.submitted2011-04
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/78014
dc.description.abstractHighly supersaturated solid solutions of selenium or sulfur in silicon were formed by ion implantation followed by nanosecond pulsed laser melting. n[superscript +]p photodiodes fabricated from these materials exhibit gain (external quantum efficiency >3000%) at 12 V of reverse bias and substantial optoelectronic response to light of wavelengths as long as 1250 nm. The amount of gain and the strength of the extended response both decrease with decreasing magnitude of bias voltage, but >100% external quantum efficiency is observed even at 2 V of reverse bias. The behavior is inconsistent with our expectations for avalanche gain or photoconductive gain.en_US
dc.description.sponsorshipArmy Armament Research, Development, and Engineering Center (U.S.) (Contract W15QKN-07-P-0092)en_US
dc.description.sponsorshipUnited States. Army Research Office (Grant W911NF-09-1-0470)en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3609871en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleExtended infrared photoresponse and gain in chalcogen-supersaturated silicon photodiodesen_US
dc.typeArticleen_US
dc.identifier.citationSaid, Aurore J. et al. “Extended Infrared Photoresponse and Gain in Chalcogen-supersaturated Silicon Photodiodes.” Applied Physics Letters 99.7 (2011): 073503. © 2011 American Institute of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorSullivan, Joseph Timothy
dc.contributor.mitauthorBuonassisi, Tonio
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSaid, Aurore J.; Recht, Daniel; Sullivan, Joseph T.; Warrender, Jeffrey M.; Buonassisi, Tonio; Persans, Peter D.; Aziz, Michael J.en
dc.identifier.orcidhttps://orcid.org/0000-0001-8345-4937
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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