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Modeling quantum noise for efficient testing of fault-tolerant circuits

Author(s)
Magesan, Easwar; Puzzuoli, Daniel; Granade, Christopher E.; Cory, David G.
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Abstract
Understanding fault-tolerant properties of quantum circuits is important for designing large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationship between properties such as the noise model, encoding scheme, and threshold value. For general noisy circuits, these simulations quickly become intractable in the size of the encoded circuit. We introduce a general theoretical method for approximating a noise process by one that allows for efficient Monte Carlo simulation of properties of encoded circuits. The approximation is as close to the original process as possible without overestimating its ability to preserve quantum information, a key property for obtaining honest estimates of threshold values. We numerically illustrate the method with various physically relevant noise models.
Date issued
2013-01
URI
http://hdl.handle.net/1721.1/78268
Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Journal
Physical Review A
Publisher
American Physical Society
Citation
Magesan, Easwar et al. “Modeling Quantum Noise for Efficient Testing of Fault-tolerant Circuits.” Physical Review A 87.1 (2013). ©2013 American Physical Society
Version: Final published version
ISSN
1050-2947
1094-1622

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