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dc.contributor.authorSix, Pierre
dc.contributor.authorKamrin, Kenneth N.
dc.date.accessioned2013-05-14T14:58:32Z
dc.date.available2013-05-14T14:58:32Z
dc.date.issued2013-02
dc.date.submitted2012-11
dc.identifier.issn1070-6631
dc.identifier.issn1089-7666
dc.identifier.urihttp://hdl.handle.net/1721.1/78878
dc.description.abstractShear flows of viscous fluid layers over nonuniformly hydrophobic surfaces are characterized in the far-field by an effective slip velocity, which relates to the applied stress through some mobility tensor characterizing the surface. Here, we identify two methods to determine the mobility tensor for flat surfaces with arbitrary slip-length variations. A family of “Cross Flow Identities” is then analyzed, which equate mobility components of different unidirectional patternings. We also calculate an analytical mobility solution for a family of continuously varying patterns. We validate the results numerically and discuss implications in various limits.en_US
dc.description.sponsorshipMIT-France Programen_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4790536en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleSome exact properties of the effective slip over surfaces with hydrophobic patterningsen_US
dc.typeArticleen_US
dc.identifier.citationSix, Pierre, and Ken Kamrin. Some Exact Properties of the Effective Slip over Surfaces with Hydrophobic Patternings. Physics of Fluids 25(2): 021703, 2013. © 2013 American Institute of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorKamrin, Kenneth N.
dc.relation.journalPhysics of Fluidsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsSix, Pierre; Kamrin, Kenen
dc.identifier.orcidhttps://orcid.org/0000-0002-5154-9787
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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