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dc.contributor.authorGiovannetti, Vittorio
dc.contributor.authorLloyd, Seth
dc.contributor.authorMaccone, Lorenzo
dc.date.accessioned2013-05-28T14:33:13Z
dc.date.available2013-05-28T14:33:13Z
dc.date.issued2011-03
dc.identifier.issn1749-4885
dc.identifier.issn1749-4893
dc.identifier.urihttp://hdl.handle.net/1721.1/78939
dc.description.abstractThe statistical error in any estimation can be reduced by repeating the measurement and averaging the results. The central limit theorem implies that the reduction is proportional to the square root of the number of repetitions. Quantum metrology is the use of quantum techniques such as entanglement to yield higher statistical precision than purely classical approaches. In this Review, we analyse some of the most promising recent developments of this research field and point out some of the new experiments. We then look at one of the major new trends of the field: analyses of the effects of noise and experimental imperfections.en_US
dc.language.isoen_US
dc.publisherNature Publishing Groupen_US
dc.relation.isversionofhttp://dx.doi.org/10.1038/nphoton.2011.35en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourcearXiven_US
dc.titleAdvances in quantum metrologyen_US
dc.typeArticleen_US
dc.identifier.citationGiovannetti, Vittorio, Seth Lloyd, and Lorenzo Maccone. Advances in Quantum Metrology. Nature Photonics 5, no. 4 (April 2011): 222-229.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorLloyd, Sethen_US
dc.relation.journalNature Photonicsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsGiovannetti, Vittorio; Lloyd, Seth; Maccone, Lorenzoen_US
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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