Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes
Author(s)
La O', Gerardo Jose Cordova; Shao-Horn, Yang
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Oxygen reduction reaction (ORR) kinetics was investigated on dense La₀.₈Sr₀.₂MnO₃ microelectrodes as a function of temperature and microelectrode thickness using electrochemical impedance spectroscopy. The surface oxygen exchange and mixed bulk/three-phase-boundary (TPB) charge transfer process were found to control ORR kinetics at high and low temperatures, respectively. The transition temperature from the mixed bulk/TPB charge transfer control to surface oxygen exchange was found to be highly dependent on the microelectrode thickness (~600degrees C for 65 nm vs ~800degreesC for 705 nm). These findings can be used to guide the design of electrodes that can operate at intermediate temperatures.
Date issued
2009-03Department
Massachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Electrochemical Energy LaboratoryJournal
Electrochemical and Solid-State Letters
Publisher
Electrochemical Society
Citation
la O’, G. J., and Y. Shao-Horn. Thickness Dependence of Oxygen Reduction Reaction Kinetics on Strontium-Substituted Lanthanum Manganese Perovskite Thin-Film Microelectrodes. Electrochemical and Solid-State Letters 12, no. 5 (2009): B82. © 2009 by ECS -- The Electrochemical Society.
Version: Final published version
ISSN
1099-0062