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dc.contributor.authorSheng, Xing
dc.contributor.authorLiu, Jifeng
dc.contributor.authorKozinsky, Inna
dc.contributor.authorMichel, Jurgen
dc.contributor.authorKimerling, Lionel C.
dc.contributor.authorAgarwal, Anuradha Murthy
dc.date.accessioned2013-08-05T14:10:57Z
dc.date.available2013-08-05T14:10:57Z
dc.date.issued2010-06
dc.identifier.isbn978-1-4244-5890-5
dc.identifier.issn0160-8371
dc.identifier.urihttp://hdl.handle.net/1721.1/79773
dc.description.abstractThin film silicon solar cells are believed to be promising candidates for continuing cost reduction in photovoltaic panels because silicon usage could be greatly reduced. Since silicon is an indirect bandgap semiconductor, its absorption coefficient is low for photons in the wavelength ranges between 600nm and 1100nm. For high efficiency thin film modules, effective light trapping is essential. Traditional schemes such as textured transparent conductive oxide (TCO) and metal reflector have several disadvantages such as enhanced surface recombination, parasitic losses at the TCO/metal interface, and the lack of ability to control and optimize the textured surface. We have previously proposed to employ a light trapping structure, which combines a self-assembled submicron grating and a distributed Bragg reflector (DBR) on the backside of thin film silicon solar cells. The DBR works as a one-dimensional photonic crystal to obtain almost 100% reflectivity. The grating scatters the incident light into oblique angles to significantly enhance the optical path length. Numerical calculations predict that by optimizing the feature sizes of the grating and DBR, up to 31% relative efficiency increase can be obtained, compared to the bare thin film Si. By using self-assembly, the organized grating structure can be formed spontaneously at a much lower cost. Current-voltage relations and quantum efficiency measurements were taken to verify the performance of our designed back structure. In the wavelength range of 600-900nm, photon absorption is greatly enhanced. As a result, more than 20% relative efficiency enhancement is achieved for 1.5um thin film silicon cells. These numerical and experimental results show that a light trapping design can be low-cost and increase efficiencies for high performance thin film Si solar cells.en_US
dc.description.sponsorshipRobert Bosch GmbHen_US
dc.description.sponsorshipMassachusetts Institute of Technology. Energy Initiativeen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/PVSC.2010.5617124en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceIEEEen_US
dc.titleEfficient light trapping structure in thin film silicon solar cellsen_US
dc.typeArticleen_US
dc.identifier.citationSheng, Xing, Jifeng Liu, Inna Kozinsky, Anuradha M. Agarwal, Jurgen Michel, and Lionel C. Kimerling. “Efficient light trapping structure in thin film silicon solar cells.” In 2010 35th IEEE Photovoltaic Specialists Conference, 001575-001576. © Copyright 2010 IEEEen_US
dc.contributor.departmentMIT Materials Research Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorSheng, Xingen_US
dc.contributor.mitauthorLiu, Jifengen_US
dc.contributor.mitauthorAgarwal, Anuradha Murthyen_US
dc.contributor.mitauthorMichel, Jurgenen_US
dc.contributor.mitauthorKimerling, Lionel C.en_US
dc.relation.journalProceedings of the Photovoltaic Specialists Conference (PVSC), 2010 35th IEEEen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsSheng, Xing; Liu, Jifeng; Kozinsky, Inna; Agarwal, Anuradha M.; Michel, Jurgen; Kimerling, Lionel C.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3913-6189
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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