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dc.contributor.authorRobertson, Ian M.
dc.contributor.authorSchuh, Christopher A.
dc.contributor.authorVetrano, John S.
dc.contributor.authorBrowning, Nigel D.
dc.contributor.authorField, David P.
dc.contributor.authorJensen, Dorte Juul
dc.contributor.authorMiller, Michael K.
dc.contributor.authorBaker, Ian
dc.contributor.authorDunand, David C.
dc.contributor.authorDunin-Borkowski, Rafal
dc.contributor.authorKabius, Bernd
dc.contributor.authorKelly, Tom
dc.contributor.authorLozano-Perez, Sergio
dc.contributor.authorMisra, Amit
dc.contributor.authorRohrer, Gregory S.
dc.contributor.authorRollett, Anthony D.
dc.contributor.authorTaheri, Mitra L.
dc.contributor.authorThompson, Greg B.
dc.contributor.authorUchic, Michael
dc.contributor.authorWang, Xun-Li
dc.contributor.authorWas, Gary
dc.date.accessioned2013-08-05T16:05:05Z
dc.date.available2013-08-05T16:05:05Z
dc.date.issued2011-06
dc.date.submitted2011-01
dc.identifier.issn0884-2914
dc.identifier.issn2044-5326
dc.identifier.urihttp://hdl.handle.net/1721.1/79779
dc.description.abstractThe material characterization toolbox has recently experienced a number of parallel revolutionary advances, foreshadowing a time in the near future when material scientists can quantify material structure evolution across spatial and temporal space simultaneously. This will provide insight to reaction dynamics in four-dimensions, spanning multiple orders of magnitude in both temporal and spatial space. This study presents the authors’ viewpoint on the material characterization field, reviewing its recent past, evaluating its present capabilities, and proposing directions for its future development. Electron microscopy; atom probe tomography; x-ray, neutron and electron tomography; serial sectioning tomography; and diffraction-based analysis methods are reviewed, and opportunities for their future development are highlighted. Advances in surface probe microscopy have been reviewed recently and, therefore, are not included [D.A. Bonnell et al.: Rev. Modern Phys. in Review]. In this study particular attention is paid to studies that have pioneered the synergetic use of multiple techniques to provide complementary views of a single structure or process; several of these studies represent the state-of-the-art in characterization and suggest a trajectory for the continued development of the field. Based on this review, a set of grand challenges for characterization science is identified, including suggestions for instrumentation advances, scientific problems in microstructure analysis, and complex structure evolution problems involving material damage. The future of microstructural characterization is proposed to be one not only where individual techniques are pushed to their limits, but where the community devises strategies of technique synergy to address complex multiscale problems in materials science and engineering.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Basic Energy Sciences (Council of Materials Science and Engineering)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant DMR-0855402)en_US
dc.language.isoen_US
dc.publisherCambridge University Press (Materials Research Society)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1557/jmr.2011.41en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleTowards an integrated materials characterization toolboxen_US
dc.typeArticleen_US
dc.identifier.citationRobertson, Ian M., Christopher A. Schuh, John S. Vetrano, Nigel D. Browning, David P. Field, Dorte Juul Jensen, Michael K. Miller, et al. “Towards an integrated materials characterization toolbox.” Journal of Materials Research 26, no. 11 (June 7, 2011): 1341-1383. Copyright © Materials Research Society 2011en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.mitauthorSchuh, Christopher A.en_US
dc.relation.journalJournal of Materials Researchen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRobertson, Ian M.; Schuh, Christopher A.; Vetrano, John S.; Browning, Nigel D.; Field, David P.; Jensen, Dorte Juul; Miller, Michael K.; Baker, Ian; Dunand, David C.; Dunin-Borkowski, Rafal; Kabius, Bernd; Kelly, Tom; Lozano-Perez, Sergio; Misra, Amit; Rohrer, Gregory S.; Rollett, Anthony D.; Taheri, Mitra L.; Thompson, Greg B.; Uchic, Michael; Wang, Xun-Li; Was, Garyen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-9856-2682
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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