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dc.contributor.authorHernandez Rivera, Javier
dc.contributor.authorHoque, Mohammed Ehasanul
dc.contributor.authorPicard, Rosalind W.
dc.date.accessioned2013-08-29T20:44:29Z
dc.date.available2013-08-29T20:44:29Z
dc.date.issued2012-08
dc.identifier.isbn9781450316804
dc.identifier.urihttp://hdl.handle.net/1721.1/80315
dc.description.abstractHave you ever wondered whether it's possible to quantitatively measure how friendly or welcoming a community is? Or imagined which parts of the community are happier than others? In this work, we introduce a new technology that begins to address these questions.en_US
dc.language.isoen_US
dc.publisherAssociation for Computing Machineryen_US
dc.relation.isversionofhttp://dx.doi.org/10.1145/2343456.2343471en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleMood Meter: Large-Scale and Long-Term Smile Monitoring Systemen_US
dc.typeArticleen_US
dc.identifier.citationHernandez, Javier, Mohammed E. Hoque, and Rosalind W. Picard. “Mood Meter.” In ACM SIGGRAPH 2012 Emerging Technologies on - SIGGRAPH 12, Los Angeles, California, August 5 – 9, 2012.Association for Computing Machinery, 2012. p. 1-1.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentProgram in Media Arts and Sciences (Massachusetts Institute of Technology)en_US
dc.contributor.mitauthorHernandez Rivera, Javieren_US
dc.contributor.mitauthorHoque, Mohammed Ehasanulen_US
dc.contributor.mitauthorPicard, Rosalind W.en_US
dc.relation.journalACM SIGGRAPH 2012 Emerging Technologies, SIGGRAPH '12en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsHernandez, Javier; Hoque, Mohammed E.; Picard, Rosalind W.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5661-0022
dc.identifier.orcidhttps://orcid.org/0000-0001-9504-5217
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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