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dc.contributor.authorLee, Byungkun
dc.contributor.authorAldrich, Matthew Henry
dc.contributor.authorLee, ByungKun
dc.contributor.authorParadiso, Joseph A
dc.date.accessioned2013-09-11T18:55:39Z
dc.date.available2013-09-11T18:55:39Z
dc.date.issued2011-09
dc.date.submitted2011-08
dc.identifier.isbn9780819487339
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/80403
dc.description.abstractThe inherent control flexibility implied by solid-state lighting - united with the rich details offered by sensor networks - prompts us to rethink lighting control. In this research, we propose several techniques for measuring work surface illuminance and ambient light using a sensor network. The primary goal of this research is to measure work surface illuminance without distraction to the user. We discuss these techniques, including the lessons learned from our prior research. We present a new method for measuring the illuminance contribution of an arbitrary luminaire at the work surface by decomposing the modulated light into its fundamental and harmonic components.en_US
dc.description.sponsorshipMassachusetts Institute of Technology. Media Laboratoryen_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.893562en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleMethods for measuring work surface illuminance in adaptive solid state lighting networksen_US
dc.typeArticleen_US
dc.identifier.citationLee, Byungkun, Matthew Aldrich, and Joseph A. Paradiso. “Methods for measuring work surface illuminance in adaptive solid state lighting networks.” In Eleventh International Conference on Solid State Lighting, edited by Matthew H. Kane, Christian Wetzel, and Jian-Jang Huang, 81230V-81230V-10. SPIE - International Society for Optical Engineering, 2011.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Responsive Environments Groupen_US
dc.contributor.departmentProgram in Media Arts and Sciences (Massachusetts Institute of Technology)en_US
dc.contributor.mitauthorLee, ByungKunen_US
dc.contributor.mitauthorAldrich, Matthew Henryen_US
dc.contributor.mitauthorParadiso, Joseph A.en_US
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineering; v.8123en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsLee, Byungkun; Aldrich, Matthew; Paradiso, Joseph A.en_US
dc.identifier.orcidhttps://orcid.org/0000-0001-5262-2264
dc.identifier.orcidhttps://orcid.org/0000-0002-0719-7104
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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