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dc.contributor.authorSciolla, Gabriella
dc.contributor.authorCowan, Ray F
dc.contributor.authorDujmic, Denis
dc.date.accessioned2013-10-15T17:15:02Z
dc.date.available2013-10-15T17:15:02Z
dc.date.issued2013-07
dc.date.submitted2013-04
dc.identifier.issn1550-7998
dc.identifier.issn1550-2368
dc.identifier.urihttp://hdl.handle.net/1721.1/81389
dc.description.abstractWe present results for a time-dependent Dalitz plot measurement of CP-violating asymmetries in the mode B[superscript 0]→π[superscript +]π[superscript -]π[superscript 0]. The data set is derived from the complete sample of 471×10[superscript 6] BB̅ meson pairs collected with the BABAR detector at the PEP-II asymmetric-energy e[superscript +]e[superscript -] collider at the SLAC National Accelerator Laboratory operating on the Υ(4S) resonance. We extract parameters describing the time-dependent B[superscript 0]→ρπ decay probabilities and CP asymmetries, including C=0.016±0.059±0.036, ΔC=0.234±0.061±0.048, S=0.053±0.081±0.034, and ΔS=0.054±0.082±0.039, where the uncertainties are statistical and systematic, respectively. We perform a two-dimensional likelihood scan of the direct CP-violation asymmetry parameters for B[superscript 0]→ρ[superscript ±]π[superscript ∓] decays, finding the change in χ[superscript 2] between the minimum and the origin (corresponding to no direct CP violation) to be Δχ[superscript 2]=6.42. We present information on the CP-violating parameter α in a likelihood scan that incorporates B[superscript ±]→ρπ measurements. To aid in the interpretation of our results, statistical robustness studies are performed to assess the reliability with which the true values of the physics parameters can be extracted. Significantly, these studies indicate that α cannot be reliably extracted with our current sample size, though the other physics parameters are robustly extracted.en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipAlfred P. Sloan Foundationen_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevD.88.012003en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleMeasurement of CP-violating asymmetries in B[superscript 0]→(ρπ)[superscript 0] decays using a time-dependent Dalitz plot analysisen_US
dc.typeArticleen_US
dc.identifier.citationLees, J. P., V. Poireau, V. Tisserand, E. Grauges, A. Palano, G. Eigen, B. Stugu, et al. “Measurement of CP-violating asymmetries in B^{0}→(ρπ)^{0} decays using a time-dependent Dalitz plot analysis.” Physical Review D 88, no. 1 (July 2013). © 2013 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.mitauthorSciolla, Gabriellaen_US
dc.contributor.mitauthorCowan, Ray Franklinen_US
dc.contributor.mitauthorDujmic, D.en_US
dc.relation.journalPhysical Review Den_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsLees, J. P.; Poireau, V.; Tisserand, V.; Grauges, E.; Palano, A.; Eigen, G.; Stugu, B.; Brown, D. N.; Kerth, L. T.; Kolomensky, Yu. G.; Lynch, G.; Koch, H.; Schroeder, T.; Asgeirsson, D. J.; Hearty, C.; Mattison, T. S.; McKenna, J. A.; So, R. Y.; Khan, A.; Blinov, V. E.; Buzykaev, A. R.; Druzhinin, V. P.; Golubev, V. B.; Kravchenko, E. A.; Onuchin, A. P.; Serednyakov, S. I.; Skovpen, Yu. I.; Solodov, E. P.; Todyshev, K. Yu.; Yushkov, A. N.; Kirkby, D.; Lankford, A. J.; Mandelkern, M.; Atmacan, H.; Gary, J. W.; Long, O.; Vitug, G. M.; Campagnari, C.; Hong, T. M.; Kovalskyi, D.; Richman, J. D.; West, C. A.; Eisner, A. M.; Kroseberg, J.; Lockman, W. S.; Martinez, A. J.; Schumm, B. A.; Seiden, A.; Chao, D. S.; Cheng, C. H.; Echenard, B.; Flood, K. T.; Hitlin, D. G.; Ongmongkolkul, P.; Porter, F. C.; Rakitin, A. Y.; Andreassen, R.; Huard, Z.; Meadows, B. T.; Sokoloff, M. D.; Sun, L.; Bloom, P. C.; Ford, W. T.; Gaz, A.; Nauenberg, U.; Smith, J. G.; Wagner, S. R.; Ayad, R.; Toki, W. H.; Spaan, B.; Schubert, K. R.; Schwierz, R.; Bernard, D.; Verderi, M.; Clark, P. J.; Playfer, S.; Bettoni, D.; Bozzi, C.; Calabrese, R.; Cibinetto, G.; Fioravanti, E.; Garzia, I.; Luppi, E.; Piemontese, L.; Santoro, V.; Baldini-Ferroli, R.; Calcaterra, A.; de Sangro, R.; Finocchiaro, G.; Patteri, P.; Peruzzi, I. M.; Piccolo, M.; Rama, M.; Zallo, A.; Contri, R.; Guido, E.; Lo Vetere, M.; Monge, M. R.; Passaggio, S.; Patrignani, C.; Robutti, E.; Bhuyan, B.; Prasad, V.; Morii, M.; Adametz, A.; Uwer, U.; Lacker, H. M.; Lueck, T.; Dauncey, P. D.; Mallik, U.; Chen, C.; Cochran, J.; Meyer, W. T.; Prell, S.; Rubin, A. E.; Gritsan, A. V.; Arnaud, N.; Davier, M.; Derkach, D.; Grosdidier, G.; Le Diberder, F.; Lutz, A. M.; Malaescu, B.; Roudeau, P.; Schune, M. H.; Stocchi, A.; Wormser, G.; Lange, D. J.; Wright, D. M.; Chavez, C. A.; Coleman, J. P.; Fry, J. R.; Gabathuler, E.; Hutchcroft, D. E.; Payne, D. J.; Touramanis, C.; Bevan, A. J.; Di Lodovico, F.; Sacco, R.; Sigamani, M.; Cowan, G.; Brown, D. N.; Davis, C. L.; Denig, A. G.; Fritsch, M.; Gradl, W.; Griessinger, K.; Hafner, A.; Prencipe, E.; Barlow, R. J.; Jackson, G.; Lafferty, G. D.; Behn, E.; Cenci, R.; Hamilton, B.; Jawahery, A.; Roberts, D. A.; Dallapiccola, C.; Cowan, R.; Dujmic, D.; Sciolla, G.; Cheaib, R.; Lindemann, D.; Patel, P. M.; Robertson, S. H.; Biassoni, P.; Neri, N.; Palombo, F.; Stracka, S.; Cremaldi, L.; Godang, R.; Kroeger, R.; Sonnek, P.; Summers, D. J.; Nguyen, X.; Simard, M.; Taras, P.; De Nardo, G.; Monorchio, D.; Onorato, G.; Sciacca, C.; Martinelli, M.; Raven, G.; Jessop, C. P.; LoSecco, J. M.; Wang, W. F.; Honscheid, K.; Kass, R.; Brau, J.; Frey, R.; Sinev, N. B.; Strom, D.; Torrence, E.; Feltresi, E.; Gagliardi, N.; Margoni, M.; Morandin, M.; Posocco, M.; Rotondo, M.; Simi, G.; Simonetto, F.; Stroili, R.; Akar, S.; Ben-Haim, E.; Bomben, M.; Bonneaud, G. R.; Briand, H.; Calderini, G.; Chauveau, J.; Hamon, O.; Leruste, Ph.; Marchiori, G.; Ocariz, J.; Sitt, S.; Biasini, M.; Manoni, E.; Pacetti, S.; Rossi, A.; Angelini, C.; Batignani, G.; Bettarini, S.; Carpinelli, M.; Casarosa, G.; Cervelli, A.; Forti, F.; Giorgi, M. A.; Lusiani, A.; Oberhof, B.; Perez, A.; Rizzo, G.; Walsh, J. J.; Lopes Pegna, D.; Olsen, J.; Smith, A. J. S.; Anulli, F.; Faccini, R.; Ferrarotto, F.; Ferroni, F.; Gaspero, M.; Li Gioi, L.; Mazzoni, M. A.; Piredda, G.; Bünger, C.; Grünberg, O.; Hartmann, T.; Leddig, T.; Voß, C.; Waldi, R.; Adye, T.; Olaiya, E. O.; Wilson, F. F.; Emery, S.; Hamel de Monchenault, G.; Vasseur, G.; Yèche, Ch.; Aston, D.; Bartoldus, R.; Benitez, J. F.; Cartaro, C.; Convery, M. R.; Dorfan, J.; Dubois-Felsmann, G. P.; Dunwoodie, W.; Ebert, M.; Field, R. C.; Franco Sevilla, M.; Fulsom, B. G.; Gabareen, A. M.; Graham, M. T.; Grenier, P.; Hast, C.; Innes, W. R.; Kelsey, M. H.; Kim, P.; Kocian, M. L.; Leith, D. W. G. S.; Lewis, P.; Lindquist, B.; Luitz, S.; Luth, V.; Lynch, H. L.; MacFarlane, D. B.; Muller, D. R.; Neal, H.; Nelson, S.; Perl, M.; Pulliam, T.; Ratcliff, B. N.; Roodman, A.; Salnikov, A. A.; Schindler, R. H.; Snyder, A.; Su, D.; Sullivan, M. K.; Va’vra, J.; Wagner, A. P.; Wisniewski, W. J.; Wittgen, M.; Wright, D. H.; Wulsin, H. W.; Young, C. C.; Ziegler, V.; Park, W.; Purohit, M. V.; White, R. M.; Wilson, J. R.; Randle-Conde, A.; Sekula, S. J.; Bellis, M.; Burchat, P. R.; Miyashita, T. S.; Puccio, E. M. T.; Alam, M. S.; Ernst, J. A.; Gorodeisky, R.; Guttman, N.; Peimer, D. R.; Soffer, A.; Spanier, S. M.; Ritchie, J. L.; Ruland, A. M.; Schwitters, R. F.; Wray, B. C.; Izen, J. M.; Lou, X. C.; Bianchi, F.; Gamba, D.; Zambito, S.; Lanceri, L.; Vitale, L.; Martinez-Vidal, F.; Oyanguren, A.; Villanueva-Perez, P.; Ahmed, H.; Albert, J.; Banerjee, Sw.; Bernlochner, F. U.; Choi, H. H. F.; King, G. J.; Kowalewski, R.; Lewczuk, M. J.; Nugent, I. M.; Roney, J. M.; Sobie, R. J.; Tasneem, N.; Gershon, T. J.; Harrison, P. F.; Latham, T. E.; Band, H. R.; Dasu, S.; Pan, Y.; Prepost, R.; Wu, S. L.en_US
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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