MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
  • DSpace@MIT Home
  • MIT Open Access Articles
  • MIT Open Access Articles
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

A taxonomy of perturbations: Determining the ways that systems lose value

Author(s)
Mekdeci, Brian Anthony; Ross, Adam Michael; Rhodes, Donna H.; Hastings, Daniel E.
Thumbnail
DownloadMEKDECI_IEEE12.pdf (881.1Kb)
OPEN_ACCESS_POLICY

Open Access Policy

Creative Commons Attribution-Noncommercial-Share Alike

Terms of use
Creative Commons Attribution-Noncommercial-Share Alike 3.0 http://creativecommons.org/licenses/by-nc-sa/3.0/
Metadata
Show full item record
Abstract
Disturbances and disruptions, both internal and external to the system, are a major concern for system architects who are responsible for ensuring that their systems maintain value robustness no matter what occurs. These perturbations can have multiple causes and can affect a system in multiple ways. This paper presents a taxonomy of disturbances and disruptions to assist system architects and researchers in identifying the ways in which systems can fail to deliver value. By doing so, this taxonomy falls into a larger research effort to develop survivability design principles that will help system architects design systems that prevent, mitigate and recover from disturbances.
Date issued
2012-03
URI
http://hdl.handle.net/1721.1/82528
Department
Massachusetts Institute of Technology. Engineering Systems Division; MIT Sociotechnical Systems Research Center
Journal
Proceedings of the 2012 IEEE International Systems Conference (SysCon 2012)
Publisher
Institute of Electrical and Electronics Engineers
Citation
Mekdeci, Brian, Adam M. Ross, Donna H. Rhodes, and Daniel E. Hastings. “A taxonomy of perturbations: Determining the ways that systems lose value.” In 2012 IEEE International Systems Conference (SysCon 2012), 1-6. Institute of Electrical and Electronics Engineers, 2012.
Version: Author's final manuscript
Other identifiers
INSPEC Accession Number: 12695537
ISBN
978-1-4673-0750-5
978-1-4673-0748-2
978-1-4673-0749-9

Collections
  • MIT Open Access Articles

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.