dc.contributor.author | Willner, Dana | |
dc.contributor.author | Hugenholtz, Philip | |
dc.contributor.author | Rabaey, Korneel | |
dc.contributor.author | Buie, Cullen R. | |
dc.contributor.author | Braff, William | |
dc.date.accessioned | 2014-01-06T19:25:00Z | |
dc.date.available | 2014-01-06T19:25:00Z | |
dc.date.issued | 2013-10 | |
dc.date.submitted | 2013-03 | |
dc.identifier.issn | 1932-6203 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/83513 | |
dc.description.abstract | Insulator-based dielectrophoresis can be used to manipulate biological particles, but has thus far found limited practical applications due to low sensitivity. We present linear sweep three-dimensional insulator-based dielectrophoresis as a considerably more sensitive approach for strain-level discrimination bacteria. In this work, linear sweep three-dimensional insulator-based dielectrophoresis was performed on Pseudomonas aeruginosa PA14 along with six isogenic mutants as well as Streptococcus mitis SF100 and PS344. Strain-level discrimination was achieved between these clinically important pathogens with applied electric fields below 10 V/mm. This low voltage, high sensitivity technique has potential applications in clinical diagnostics as well as microbial physiology research. | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Award 1150615) | en_US |
dc.description.sponsorship | MISTI Hayashi Seed Fund | en_US |
dc.language.iso | en_US | |
dc.publisher | Public Library of Science | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1371/journal.pone.0076751 | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by/2.5/ | en_US |
dc.source | PLoS | en_US |
dc.title | Dielectrophoresis-Based Discrimination of Bacteria at the Strain Level Based on Their Surface Properties | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Braff, William A., Dana Willner, Philip Hugenholtz, Korneel Rabaey, and Cullen R. Buie. “Dielectrophoresis-Based Discrimination of Bacteria at the Strain Level Based on Their Surface Properties.” Edited by Arum Han. PLoS ONE 8, no. 10 (October 16, 2013): e76751. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | en_US |
dc.contributor.mitauthor | Braff, William | en_US |
dc.contributor.mitauthor | Buie, Cullen R. | en_US |
dc.relation.journal | PLoS ONE | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Braff, William A.; Willner, Dana; Hugenholtz, Philip; Rabaey, Korneel; Buie, Cullen R. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-2275-4570 | |
dc.identifier.orcid | https://orcid.org/0000-0001-9529-2912 | |
mit.license | PUBLISHER_CC | en_US |
mit.metadata.status | Complete | |