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dc.contributor.authorHutchinson, Ian Horner
dc.date.accessioned2014-01-13T18:27:57Z
dc.date.available2014-01-13T18:27:57Z
dc.date.issued2012-07
dc.date.submitted2012-05
dc.identifier.issn2190-5444
dc.identifier.urihttp://hdl.handle.net/1721.1/83906
dc.description.abstractElementary but general statistical analyses determine the uncertainty arising from photon statistics in measuring a line shift and width. Account is taken of a background as well as the required signal.en_US
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.relation.isversionofhttp://dx.doi.org/10.1140/epjp/i2012-12081-3en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alike 3.0en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/3.0/en_US
dc.sourceHutchinson via Chris Sherratten_US
dc.titleStatistical uncertainty in line shift and width interpretationen_US
dc.typeArticleen_US
dc.identifier.citationHutchinson, I. H. “Statistical uncertainty in line shift and width interpretation.” The European Physical Journal Plus 127, no. 7 (July 25, 2012).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Nuclear Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Centeren_US
dc.contributor.approverHutchinson, Ianen_US
dc.contributor.mitauthorHutchinson, Ian H.en_US
dc.relation.journalThe European Physical Journal Plusen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsHutchinson, I. H.en_US
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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