dc.contributor.author | Demaine, Erik D. | |
dc.contributor.author | Iacono, John | |
dc.contributor.author | Langerman, Stefan | |
dc.date.accessioned | 2014-04-11T19:51:16Z | |
dc.date.available | 2014-04-11T19:51:16Z | |
dc.date.issued | 2014-01 | |
dc.date.submitted | 2011-04 | |
dc.identifier.issn | 0178-4617 | |
dc.identifier.issn | 1432-0541 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/86132 | |
dc.description.abstract | Consider laying out a fixed-topology binary tree of N nodes into external memory with block size B so as to minimize the worst-case number of block memory transfers required to traverse a path from the root to a node of depth D. We prove that the optimal number of memory transfers is Θ([D over lg(1+B))] when D = O(lgN), Θ([lgN over lg(1+[BlgN over D])]) when D=Ω(lgN) and D=O(BlgN), Θ([D over B]) ,when D=Ω(BlgN). | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Grant CCF-0430849) | en_US |
dc.description.sponsorship | National Science Foundation (U.S.) (Grant OISE-0334653) | en_US |
dc.language.iso | en_US | |
dc.publisher | Springer-Verlag | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1007/s00453-013-9856-2 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | MIT web domain | en_US |
dc.title | Worst-Case Optimal Tree Layout in External Memory | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Demaine, Erik D., John Iacono, and Stefan Langerman. “Worst-Case Optimal Tree Layout in External Memory.” Algorithmica (January 15, 2014). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.mitauthor | Demaine, Erik D. | en_US |
dc.relation.journal | Algorithmica | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.orderedauthors | Demaine, Erik D.; Iacono, John; Langerman, Stefan | en_US |
dc.identifier.orcid | https://orcid.org/0000-0003-3803-5703 | |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |