Show simple item record

dc.contributor.authorDemaine, Erik D.
dc.contributor.authorIacono, John
dc.contributor.authorLangerman, Stefan
dc.date.accessioned2014-04-11T19:51:16Z
dc.date.available2014-04-11T19:51:16Z
dc.date.issued2014-01
dc.date.submitted2011-04
dc.identifier.issn0178-4617
dc.identifier.issn1432-0541
dc.identifier.urihttp://hdl.handle.net/1721.1/86132
dc.description.abstractConsider laying out a fixed-topology binary tree of N nodes into external memory with block size B so as to minimize the worst-case number of block memory transfers required to traverse a path from the root to a node of depth D. We prove that the optimal number of memory transfers is Θ([D over lg(1+B))] when D = O(lgN), Θ([lgN over lg(1+[BlgN over D])]) when D=Ω(lgN) and D=O(BlgN), Θ([D over B]) ,when D=Ω(BlgN).en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CCF-0430849)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant OISE-0334653)en_US
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/s00453-013-9856-2en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleWorst-Case Optimal Tree Layout in External Memoryen_US
dc.typeArticleen_US
dc.identifier.citationDemaine, Erik D., John Iacono, and Stefan Langerman. “Worst-Case Optimal Tree Layout in External Memory.” Algorithmica (January 15, 2014).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorDemaine, Erik D.en_US
dc.relation.journalAlgorithmicaen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsDemaine, Erik D.; Iacono, John; Langerman, Stefanen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-3803-5703
mit.licenseOPEN_ACCESS_POLICYen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record