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dc.contributor.authorRuhrmair, Ulrich
dc.contributor.authorSolter, Jan
dc.contributor.authorSehnke, Frank
dc.contributor.authorXu, Xiaolin
dc.contributor.authorMahmoud, Ahmed
dc.contributor.authorStoyanova, Vera
dc.contributor.authorDror, Gideon
dc.contributor.authorSchmidhuber, Jurgen
dc.contributor.authorBurleson, Wayne
dc.contributor.authorDevadas, Srinivas
dc.date.accessioned2014-04-14T17:17:08Z
dc.date.available2014-04-14T17:17:08Z
dc.date.issued2013-08
dc.date.submitted2013-06
dc.identifier.issn1556-6013
dc.identifier.issn1556-6021
dc.identifier.urihttp://hdl.handle.net/1721.1/86157
dc.description.abstractWe discuss numerical modeling attacks on several proposed strong physical unclonable functions (PUFs). Given a set of challenge-response pairs (CRPs) of a Strong PUF, the goal of our attacks is to construct a computer algorithm which behaves indistinguishably from the original PUF on almost all CRPs. If successful, this algorithm can subsequently impersonate the Strong PUF, and can be cloned and distributed arbitrarily. It breaks the security of any applications that rest on the Strong PUF's unpredictability and physical unclonability. Our method is less relevant for other PUF types such as Weak PUFs. The Strong PUFs that we could attack successfully include standard Arbiter PUFs of essentially arbitrary sizes, and XOR Arbiter PUFs, Lightweight Secure PUFs, and Feed-Forward Arbiter PUFs up to certain sizes and complexities. We also investigate the hardness of certain Ring Oscillator PUF architectures in typical Strong PUF applications. Our attacks are based upon various machine learning techniques, including a specially tailored variant of logistic regression and evolution strategies. Our results are mostly obtained on CRPs from numerical simulations that use established digital models of the respective PUFs. For a subset of the considered PUFs-namely standard Arbiter PUFs and XOR Arbiter PUFs-we also lead proofs of concept on silicon data from both FPGAs and ASICs. Over four million silicon CRPs are used in this process. The performance on silicon CRPs is very close to simulated CRPs, confirming a conjecture from earlier versions of this work. Our findings lead to new design requirements for secure electrical Strong PUFs, and will be useful to PUF designers and attackers alike.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CNS 0923313)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant CNS 0964641)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TIFS.2013.2279798en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titlePUF Modeling Attacks on Simulated and Silicon Dataen_US
dc.typeArticleen_US
dc.identifier.citationRuhrmair, Ulrich, Jan Solter, Frank Sehnke, Xiaolin Xu, Ahmed Mahmoud, Vera Stoyanova, Gideon Dror, Jurgen Schmidhuber, Wayne Burleson, and Srinivas Devadas. “PUF Modeling Attacks on Simulated and Silicon Data.” IEEE Transactions on Information Forensics and Security 8, no. 11 (n.d.): 1876–1891.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratoryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorDevadas, Srinivasen_US
dc.relation.journalIEEE Transactions on Information Forensics and Securityen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRuhrmair, Ulrich; Solter, Jan; Sehnke, Frank; Xu, Xiaolin; Mahmoud, Ahmed; Stoyanova, Vera; Dror, Gideon; Schmidhuber, Jurgen; Burleson, Wayne; Devadas, Srinivasen_US
dc.identifier.orcidhttps://orcid.org/0000-0001-8253-7714
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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