Show simple item record

dc.contributor.authorKumar, Sushil
dc.contributor.authorHu, Qing
dc.date.accessioned2014-05-01T18:39:55Z
dc.date.available2014-05-01T18:39:55Z
dc.date.issued2012-01
dc.date.submitted2011-09
dc.identifier.issn00036951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/86342
dc.description.abstractThe effect of enhanced rate of spontaneous emission on gain and lasing threshold of semiconductor microcavity lasers has not been discussed clearly. Some reports have suggested that the lasing threshold in microcavities could possibly be lowered due to the so-called Purcell effect. Here, we argue that gain in weakly coupled semiconductor cavities is a local phenomenon, which occurs due to stimulated emission induced by an electromagnetic excitation and remains unaffected by the cavityboundary conditions. Hence, the Purcell effect in microcavities filled uniformly with a gain medium should not lead to a reduction in the laser’s threshold pump density, provided radiative scattering is not the dominant relaxation mechanism in the excited state. A systematic experimental investigation of laser threshold in parallel-plate semiconductor microcavity terahertz quantum-cascade lasers of different dimensions was found to be in accordance with our arguments.en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3678595en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.rights.urien_US
dc.sourceMIT web domainen_US
dc.titleInvestigation of possible microcavity effect on lasing threshold of nonradiative-scattering-dominated semiconductor lasersen_US
dc.typeArticleen_US
dc.identifier.citationKumar, Sushil, and Qing Hu. “Investigation of Possible Microcavity Effect on Lasing Threshold of Nonradiative-Scattering-Dominated Semiconductor Lasers.” Appl. Phys. Lett. 100, no. 4 (2012): 041105. © 2012 American Institute of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorHu, Qingen_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKumar, Sushil; Hu, Qingen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1982-4053
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record