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Terahertz heterodyne spectrometer using a quantum cascade laser

dc.contributor.authorRen, Y.
dc.contributor.authorHovenier, J. N.
dc.contributor.authorHiggins, R.
dc.contributor.authorGao, J. R.
dc.contributor.authorKlapwijk, T. M.
dc.contributor.authorShi, S. C.
dc.contributor.authorBell, A.
dc.contributor.authorKlein, B.
dc.contributor.authorWilliams, B. S.
dc.contributor.authorKumar, S.
dc.contributor.authorReno, J. L.
dc.contributor.authorHu, Qing
dc.date.accessioned2014-05-01T19:26:20Z
dc.date.available2014-05-01T19:26:20Z
dc.date.issued2010-10
dc.date.submitted2010-06
dc.identifier.issn00036951
dc.identifier.issn1077-3118
dc.identifier.urihttp://hdl.handle.net/1721.1/86345
dc.description.abstractA terahertz (THz) heterodyne spectrometer is demonstrated based on a quantum cascade laser(QCL) as a local oscillator (LO) and an NbN hot electron bolometer as a mixer, and it is used to measure high-resolution molecular spectral lines of methanol (CH[subscript 3]OH) between 2.913–2.918 THz. The spectral lines are taken from a gas cell containing methanol gas and using a single-mode QCL at 2.9156 THz as an LO, which is operated in the free running mode. By increasing the pressure of the gas, line broadening and saturation are observed. The measured spectra showed good agreement with a theoretical model.en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.3502479en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceMIT web domainen_US
dc.titleTerahertz heterodyne spectrometer using a quantum cascade laseren_US
dc.typeArticleen_US
dc.identifier.citationRen, Y., J. N. Hovenier, R. Higgins, J. R. Gao, T. M. Klapwijk, S. C. Shi, A. Bell, et al. “Terahertz Heterodyne Spectrometer Using a Quantum Cascade Laser.” Appl. Phys. Lett. 97, no. 16 (2010): 161105. © 2010 American Institute of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorWilliams, B. S.en_US
dc.contributor.mitauthorKumar, S.en_US
dc.contributor.mitauthorHu, Qingen_US
dc.relation.journalApplied Physics Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRen, Y.; Hovenier, J. N.; Higgins, R.; Gao, J. R.; Klapwijk, T. M.; Shi, S. C.; Bell, A.; Klein, B.; Williams, B. S.; Kumar, S.; Hu, Q.; Reno, J. L.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1982-4053
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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