| dc.contributor.author | Hu, Qing | |
| dc.contributor.author | Reno, John L. | |
| dc.contributor.author | Burghoff, David Patrick | |
| dc.contributor.author | Chan, Chun Wang Ivan | |
| dc.date.accessioned | 2014-05-02T13:40:41Z | |
| dc.date.available | 2014-05-02T13:40:41Z | |
| dc.date.issued | 2012-06 | |
| dc.date.submitted | 2012-03 | |
| dc.identifier.issn | 00036951 | |
| dc.identifier.issn | 1077-3118 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/86354 | |
| dc.description.abstract | Using terahertz time-domain spectroscopy, the gain of scattering-assisted terahertz quantum cascade lasers is measured. By examining the intersubband gain and absorption over a wide range of bias voltages, we experimentally detect energy anticrossings—revealing information about the mechanism of laser action—and compare the resonant-tunneling injection scheme to the scattering-assisted injection scheme. The temperature performance of the gain medium is also measured and discussed, and an additional intersubband transition is identified that contributes to scattering-assisted lasing action at high temperatures. | en_US |
| dc.description.sponsorship | United States. National Aeronautics and Space Administration | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | American Institute of Physics (AIP) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1063/1.4732518 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | MIT web domain | en_US |
| dc.title | Gain measurements of scattering-assisted terahertz quantum cascade lasers | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Burghoff, David, Chun Wang Ivan Chan, Qing Hu, and John L. Reno. “Gain Measurements of Scattering-Assisted Terahertz Quantum Cascade Lasers.” Appl. Phys. Lett. 100, no. 26 (2012): 261111. © 2012 American Institute of Physics | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
| dc.contributor.mitauthor | Burghoff, David Patrick | en_US |
| dc.contributor.mitauthor | Chan, Chun Wang Ivan | en_US |
| dc.contributor.mitauthor | Hu, Qing | en_US |
| dc.relation.journal | Applied Physics Letters | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Burghoff, David; Wang Ivan Chan, Chun; Hu, Qing; Reno, John L. | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0003-1982-4053 | |
| dc.identifier.orcid | https://orcid.org/0000-0001-5848-2389 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |