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dc.contributor.authorRivas, Juan M.
dc.contributor.authorHan, Yehui
dc.contributor.authorLeitermann, Olivia
dc.contributor.authorSagneri, Anthony D.
dc.contributor.authorPerreault, David J.
dc.date.accessioned2014-05-09T18:10:10Z
dc.date.available2014-05-09T18:10:10Z
dc.date.issued2008-07
dc.date.submitted2007-12
dc.identifier.issn0885-8993
dc.identifier.issn1941-0107
dc.identifier.urihttp://hdl.handle.net/1721.1/86922
dc.description.abstractThis paper presents a new switched-mode resonant inverter, which we term the inverter, that is well suited to operation at very high frequencies and to rapid on/off control. Features of this inverter topology include low semiconductor voltage stress, small passive energy storage requirements, fast dynamic response, and good design flexibility. The structure and operation of the proposed topology are described, and a design procedure is introduced. Experimental results demonstrating the new topology are also presented. A prototype inverter is described that switches at 30 MHz and provides over 500 W of radio frequency power at a drain efficiency above 92%. It is expected that the inverter will find use as a building block in high-performance dc-dc converters among other applications.en_US
dc.description.sponsorshipGeneral Electric Companyen_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agency (Robust Integrated Power Electronics)en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TPEL.2008.924616en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceVabulasen_US
dc.titleA High-Frequency Resonant Inverter Topology With Low-Voltage Stressen_US
dc.typeArticleen_US
dc.identifier.citationRivas, Juan M., Yehui Han, Olivia Leitermann, Anthony D. Sagneri, and David J. Perreault. “A High-Frequency Resonant Inverter Topology With Low-Voltage Stress.” IEEE Trans. Power Electron. 23, no. 4 (n.d.): 1759–1771. © 2008 IEEEen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Electromagnetic and Electronic Systemsen_US
dc.contributor.approverPerreault, David J.en_US
dc.contributor.mitauthorRivas, Juan M.en_US
dc.contributor.mitauthorHan, Yehuien_US
dc.contributor.mitauthorLeitermann, Oliviaen_US
dc.contributor.mitauthorSagneri, Anthony D.en_US
dc.contributor.mitauthorPerreault, David J.en_US
dc.relation.journalIEEE Transactions on Power Electronicsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsRivas, Juan M.; Han, Yehui; Leitermann, Olivia; Sagneri, Anthony D.; Perreault, David J.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-0746-6191
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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