| dc.contributor.author | Han, Yehui | |
| dc.contributor.author | Cheung, Grace | |
| dc.contributor.author | Li, An | |
| dc.contributor.author | Sullivan, Charles R. | |
| dc.contributor.author | Perreault, David J. | |
| dc.date.accessioned | 2014-05-22T17:03:18Z | |
| dc.date.available | 2014-05-22T17:03:18Z | |
| dc.date.issued | 2012-01 | |
| dc.date.submitted | 2011-05 | |
| dc.identifier.issn | 0885-8993 | |
| dc.identifier.issn | 1941-0107 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/87096 | |
| dc.description.abstract | This paper investigates the loss characteristics of RF magnetic materials for power conversion applications in the 10 to 100 MHz range. A measurement method is proposed that provides a direct measurement of an inductor quality factor QL as a function of inductor current at RF frequencies, and enables indirect calculation of core loss as a function of flux density. Possible sources of error in measurement and calculation are evaluated and addressed. The proposed method is used to identify loss characteristics of several commercial RF magnetic-core materials. The loss characteristics of these materials, which have not previously been available, are illustrated and compared in tables and figures. The use of the method and data is demonstrated in the design of a magnetic-core inductor, which is applied in a 30-MHz inverter. The results of this paper are thus useful for the design of magnetic components for very high frequency applications. | en_US |
| dc.description.sponsorship | Sheila and Emanuel Landsman Foundation | en_US |
| dc.description.sponsorship | Interconnect Focus Center (United States. Defense Advanced Research Projects Agency and Semiconductor Research Corporation) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1109/TPEL.2011.2159995 | en_US |
| dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
| dc.source | Vabulas | en_US |
| dc.title | Evaluation of Magnetic Materials for Very High Frequency Power Applications | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Han, Yehui, Grace Cheung, An Li, Charles R. Sullivan, and David J. Perreault. “Evaluation of Magnetic Materials for Very High Frequency Power Applications.” IEEE Trans. Power Electron. 27, no. 1 (n.d.): 425–435. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Laboratory for Electromagnetic and Electronic Systems | en_US |
| dc.contributor.approver | Perreault, David J. | en_US |
| dc.contributor.mitauthor | Li, An | en_US |
| dc.contributor.mitauthor | Perreault, David J. | en_US |
| dc.relation.journal | IEEE Transactions on Power Electronics | en_US |
| dc.eprint.version | Author's final manuscript | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Han, Yehui; Cheung, Grace; Li, An; Sullivan, Charles R.; Perreault, David J. | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0002-0746-6191 | |
| mit.license | OPEN_ACCESS_POLICY | en_US |
| mit.metadata.status | Complete | |