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dc.contributor.authorHu, Grace Xing
dc.contributor.authorPan, Jun
dc.contributor.authorWang, Jiang
dc.date.accessioned2014-06-17T19:56:17Z
dc.date.available2014-06-17T19:56:17Z
dc.date.issued2013-12
dc.identifier.issn00221082
dc.identifier.urihttp://hdl.handle.net/1721.1/88025
dc.description.abstractWe propose a market-wide liquidity measure by exploiting the connection between the amount of arbitrage capital in the market and observed “noise” in U.S. Treasury bonds—the shortage of arbitrage capital allows yields to deviate more freely from the curve, resulting in more noise in prices. Our noise measure captures episodes of liquidity crises of different origins across the financial market, providing information beyond existing liquidity proxies. Moreover, as a priced risk factor, it helps to explain cross-sectional returns on hedge funds and currency carry trades, both known to be sensitive to the general liquidity conditions of the market.en_US
dc.language.isoen_US
dc.publisherJohn Wiley & Sons, Incen_US
dc.relation.isversionofhttp://dx.doi.org/10.1111/jofi.12083en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleNoise as Information for Illiquidityen_US
dc.typeArticleen_US
dc.identifier.citationHu, Grace Xing, Jun Pan, and Jiang Wang. “Noise as Information for Illiquidity.” The Journal of Finance 68, no. 6 (December 2013): 2341–2382.en_US
dc.contributor.departmentSloan School of Managementen_US
dc.contributor.mitauthorPan, Junen_US
dc.contributor.mitauthorWang, Jiangen_US
dc.relation.journalJournal of Financeen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsHU, GRACE XING; PAN, JUN; WANG, JIANGen_US
dc.identifier.orcidhttps://orcid.org/0000-0003-0161-9465
dc.identifier.orcidhttps://orcid.org/0000-0002-8261-0261
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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