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dc.contributor.authorConrad, Janet
dc.contributor.authorJones, Christopher LaDon
dc.contributor.authorSpitz, Joshua B.
dc.contributor.authorTerao, Yasuaki
dc.contributor.authorWinslow, L.
dc.date.accessioned2014-07-15T14:54:58Z
dc.date.available2014-07-15T14:54:58Z
dc.date.issued2013-01
dc.identifier.issn1550-7998
dc.identifier.issn1550-2368
dc.identifier.urihttp://hdl.handle.net/1721.1/88412
dc.description.abstractDouble Chooz is unique among modern reactor-based neutrino experiments studying ν¯e disappearance in that data can be collected with all reactors off. In this paper, we present data from 7.53 days of reactor-off running. Applying the same selection criteria as used in the Double Chooz reactor-on oscillation analysis, a measured background rate of 1.0±0.4 events/day is obtained. The background model for accidentals, cosmogenic β-n-emitting isotopes, fast neutrons from cosmic muons, and stopped-μ decays used in the oscillation analysis is demonstrated to be correct within the uncertainties. Kinematic distributions of the events, which are dominantly cosmic-ray-produced correlated-background events, are provided. The background rates are scaled to the shielding depths of two other reactor-based oscillation experiments, Daya Bay and RENO.en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevD.87.011102en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourcearXiven_US
dc.titleDirect measurement of backgrounds using reactor-off data in Double Choozen_US
dc.typeArticleen_US
dc.identifier.citationAbe, Y., C. Aberle, J. C. dos Anjos, J. C. Barriere, M. Bergevin, A. Bernstein, T. J. C. Bezerra, et al. “Direct Measurement of Backgrounds Using Reactor-Off Data in Double Chooz.” Phys. Rev. D 87, no. 1 (January 2013).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Plasma Science and Fusion Centeren_US
dc.contributor.mitauthorConrad, Janeten_US
dc.contributor.mitauthorJones, Christopher LaDonen_US
dc.contributor.mitauthorSpitz, Joshua B.en_US
dc.contributor.mitauthorTerao, Yasuakien_US
dc.contributor.mitauthorWinslow, L.en_US
dc.relation.journalPhysical Review Den_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsAbe, Y.; Aberle, C.; dos Anjos, J. C.; Barriere, J. C.; Bergevin, M.; Bernstein, A.; Bezerra, T. J. C.; Bezrukhov, L.; Blucher, E.; Bowden, N. S.; Buck, C.; Busenitz, J.; Cabrera, A.; Caden, E.; Camilleri, L.; Carr, R.; Cerrada, M.; Chang, P.-J.; Chimenti, P.; Classen, T.; Collin, A. P.; Conover, E.; Conrad, J. M.; Crespo-Anadón, J. I.; Crum, K.; Cucoanes, A.; D’Agostino, M. V.; Damon, E.; Dawson, J. V.; Dazeley, S.; Dietrich, D.; Djurcic, Z.; Dracos, M.; Durand, V.; Ebert, J.; Efremenko, Y.; Elnimr, M.; Erickson, A.; Etenko, A.; Fallot, M.; Fechner, M.; von Feilitzsch, F.; Felde, J.; Fernandes, S. M.; Fischer, V.; Franco, D.; Franke, A. J.; Franke, M.; Furuta, H.; Gama, R.; Gil-Botella, I.; Giot, L.; Göger-Neff, M.; Gonzalez, L. F. G.; Goodenough, L.; Goodman, M. C.; Goon, J. T. M.; Greiner, D.; Haag, N.; Habib, S.; Hagner, C.; Hara, T.; Hartmann, F. X.; Haser, J.; Hatzikoutelis, A.; Hayakawa, T.; Hofmann, M.; Horton-Smith, G. A.; Hourlier, A.; Ishitsuka, M.; Jochum, J.; Jollet, C.; Jones, C. L.; Kaether, F.; Kalousis, L. N.; Kamyshkov, Y.; Kaplan, D. M.; Kawasaki, T.; Keefer, G.; Kemp, E.; de Kerret, H.; Kibe, Y.; Konno, T.; Kryn, D.; Kuze, M.; Lachenmaier, T.; Lane, C. E.; Langbrandtner, C.; Lasserre, T.; Letourneau, A.; Lhuillier, D.; Lima, H. P.; Lindner, M.; López-Castaño, J. M.; LoSecco, J. M.; Lubsandorzhiev, B. K.; Lucht, S.; McKee, D.; Maeda, J.; Maesano, C. N.; Mariani, C.; Maricic, J.; Martino, J.; Matsubara, T.; Mention, G.; Meregaglia, A.; Meyer, M.; Miletic, T.; Milincic, R.; Miyata, H.; Mueller, Th. A.; Nagasaka, Y.; Nakajima, K.; Novella, P.; Obolensky, M.; Oberauer, L.; Onillon, A.; Osborn, A.; Ostrovskiy, I.; Palomares, C.; Pepe, I. M.; Perasso, S.; Perrin, P.; Pfahler, P.; Porta, A.; Potzel, W.; Pronost, G.; Reichenbacher, J.; Reinhold, B.; Remoto, A.; Röhling, M.; Roncin, R.; Roth, S.; Rybolt, B.; Sakamoto, Y.; Santorelli, R.; Sato, F.; Schönert, S.; Schoppmann, S.; Schwetz, T.; Shaevitz, M. H.; Shimojima, S.; Shrestha, D.; Sida, J-L.; Sinev, V.; Skorokhvatov, M.; Smith, E.; Spitz, J.; Stahl, A.; Stancu, I.; Stokes, L. F. F.; Strait, M.; Stüken, A.; Suekane, F.; Sukhotin, S.; Sumiyoshi, T.; Sun, Y.; Svoboda, R.; Terao, K.; Tonazzo, A.; Toups, M.; Trinh Thi, H. H.; Valdiviesso, G.; Veyssiere, C.; Wagner, S.; Watanabe, H.; White, B.; Wiebusch, C.; Winslow, L.; Worcester, M.; Wurm, M.; Yermia, F.; Zimmer, V.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-9970-108X
dc.identifier.orcidhttps://orcid.org/0000-0002-6393-0438
dspace.mitauthor.errortrue
mit.licenseOPEN_ACCESS_POLICYen_US


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