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dc.contributor.authorBugel, Leonard G.
dc.contributor.authorConrad, Janet
dc.contributor.authorKaragiorgi, Georgia Stelios
dc.contributor.authorKatori, Teppei
dc.contributor.authorMcGary, Van Thanh
dc.date.accessioned2014-07-15T18:45:37Z
dc.date.available2014-07-15T18:45:37Z
dc.date.issued2013-01
dc.identifier.issn03702693
dc.identifier.urihttp://hdl.handle.net/1721.1/88414
dc.description.abstractThe sidereal time dependence of MiniBooNE ν[subscript e] and ν[over-bar][subscript e] appearance data is analyzed to search for evidence of Lorentz and CPT violation. An unbinned Kolmogorov–Smirnov (K–S) test shows both the ν[subscript e] and ν[over-bar][subscript e] appearance data are compatible with the null sidereal variation hypothesis to more than 5%. Using an unbinned likelihood fit with a Lorentz-violating oscillation model derived from the Standard Model Extension (SME) to describe any excess events over background, we find that the ν[subscript e] appearance data prefer a sidereal time-independent solution, and the ν[over-bar][subscript e] appearance data slightly prefer a sidereal time-dependent solution. Limits of order 10−20 GeV10−20 GeV are placed on combinations of SME coefficients. These limits give the best limits on certain SME coefficients for ν[subscript μ] →ν[subscript e] and ν[over-bar][subscript μ]→ν[over-bar][subscript e] oscillations. The fit values and limits of combinations of SME coefficients are provided.en_US
dc.description.sponsorshipFermi National Accelerator Laboratoryen_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipIndiana University, Bloomington. Center for Spacetime Symmetriesen_US
dc.language.isoen_US
dc.publisherElsevier B.V.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.physletb.2012.12.020en_US
dc.rightsCreative Commons Attribution-4.0 Unporteden_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceElsevier Open Accessen_US
dc.titleTest of Lorentz and CPT violation with short baseline neutrino oscillation excessesen_US
dc.typeArticleen_US
dc.identifier.citationAguilar-Arevalo, A.A., C.E. Anderson, A.O. Bazarko, S.J. Brice, B.C. Brown, L. Bugel, J. Cao, et al. “Test of Lorentz and CPT Violation with Short Baseline Neutrino Oscillation Excesses.” Physics Letters B 718, no. 4–5 (January 2013): 1303–1308.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.departmentMassachusetts Institute of Technology. Laboratory for Nuclear Scienceen_US
dc.contributor.mitauthorBugel, Leonard G.en_US
dc.contributor.mitauthorConrad, Janeten_US
dc.contributor.mitauthorKaragiorgi, Georgia Steliosen_US
dc.contributor.mitauthorKatori, Teppeien_US
dc.contributor.mitauthorMcGary, Van Thanhen_US
dc.relation.journalPhysics Letters Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsAguilar-Arevalo, A.A.; Anderson, C.E.; Bazarko, A.O.; Brice, S.J.; Brown, B.C.; Bugel, L.; Cao, J.; Coney, L.; Conrad, J.M.; Cox, D.C.; Curioni, A.; Dharmapalan, R.; Djurcic, Z.; Finley, D.A.; Fleming, B.T.; Ford, R.; Garcia, F.G.; Garvey, G.T.; Grange, J.; Green, C.; Green, J.A.; Hart, T.L.; Hawker, E.; Huelsnitz, W.; Imlay, R.; Johnson, R.A.; Karagiorgi, G.; Kasper, P.; Katori, T.; Kobilarcik, T.; Kourbanis, I.; Koutsoliotas, S.; Laird, E.M.; Linden, S.K.; Link, J.M.; Liu, Y.; Liu, Y.; Louis, W.C.; Mahn, K.B.M.; Marsh, W.; Mauger, C.; McGary, V.T.; McGregor, G.; Metcalf, W.; Meyers, P.D.; Mills, F.; Mills, G.B.; Monroe, J.; Moore, C.D.; Mousseau, J.; Nelson, R.H.; Nienaber, P.; Nowak, J.A.; Osmanov, B.; Ouedraogo, S.; Patterson, R.B.; Pavlovic, Z.; Perevalov, D.; Polly, C.C.; Prebys, E.; Raaf, J.L.; Ray, H.; Roe, B.P.; Russell, A.D.; Sandberg, V.; Schirato, R.; Schmitz, D.; Shaevitz, M.H.; Shoemaker, F.C.; Smith, D.; Soderberg, M.; Sorel, M.; Spentzouris, P.; Spitz, J.; Stancu, I.; Stefanski, R.J.; Sung, M.; Tanaka, H.A.; Tayloe, R.; Tzanov, M.; Van de Water, R.G.; Wascko, M.O.; White, D.H.; Wilking, M.J.; Yang, H.J.; Zeller, G.P.; Zimmerman, E.D.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-9429-9482
dc.identifier.orcidhttps://orcid.org/0000-0002-6393-0438
dc.identifier.orcidhttps://orcid.org/0000-0003-3837-3921
dspace.mitauthor.errortrue
mit.licensePUBLISHER_CCen_US
mit.metadata.statusComplete


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