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dc.contributor.authorAfek, Yehuda
dc.contributor.authorMatveev, Alexander
dc.contributor.authorShavit, Nir N.
dc.date.accessioned2014-10-10T13:09:02Z
dc.date.available2014-10-10T13:09:02Z
dc.date.issued2012
dc.identifier.isbn978-3-642-33650-8
dc.identifier.isbn978-3-642-33651-5
dc.identifier.issn0302-9743
dc.identifier.issn1611-3349
dc.identifier.urihttp://hdl.handle.net/1721.1/90880
dc.description.abstractRead-write locks are one of the most prevalent lock forms in concurrent applications because they allow read accesses to locked code to proceed in parallel. However, they do not offer any parallelism between reads and writes. This paper introduces pessimistic lock-elision (PLE), a new approach for non-speculatively replacing read-write locks with pessimistic (i.e. non-aborting) software transactional code that allows read-write concurrency even for contended code and even if the code includes system calls. On systems with hardware transactional support, PLE will allow failed transactions, or ones that contain system calls, to preserve read-write concurrency. Our PLE algorithm is based on a novel encounter-order design of a fully pessimistic STM system that in a variety of benchmarks spanning from counters to trees, even when up to 40% of calls are mutating the locked structure, provides up to 5 times the performance of a state-of-the-art read-write lock.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant 1217921)en_US
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.relation.isversionofhttp://dx.doi.org/10.1007/978-3-642-33651-5_21en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceOther univ. web domainen_US
dc.titlePessimistic Software Lock-Elisionen_US
dc.typeArticleen_US
dc.identifier.citationAfek, Yehuda, Alexander Matveev, and Nir Shavit. “Pessimistic Software Lock-Elision.” Lecture Notes in Computer Science (2012): 297–311.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorShavit, Nir N.en_US
dc.relation.journalDistributed Computingen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsAfek, Yehuda; Matveev, Alexander; Shavit, Niren_US
dc.identifier.orcidhttps://orcid.org/0000-0002-4552-2414
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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