dc.contributor.author | Zhang, Richard Y. | |
dc.contributor.author | White, Jacob K. | |
dc.contributor.author | Kassakian, John G. | |
dc.contributor.author | Sullivan, Charles R. | |
dc.date.accessioned | 2014-10-21T16:37:54Z | |
dc.date.available | 2014-10-21T16:37:54Z | |
dc.date.issued | 2014-03 | |
dc.identifier.isbn | 978-1-4799-2325-0 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/91048 | |
dc.description.abstract | The losses of realistic litz wires are characterized while explicitly accounting for their construction, using a procedure that computes the current-driven and magnetic-field-driven copper losses using fast numerical simulations. We present a case study that examines loss variation in one- and two-level litz wires as a function of twisting pitch, over a wide range of values and in small increments. Experimental confirmation is presented for predictions made by numerical simulations. Results confirm the capability and efficiency of numerical methods to provide valuable insights into the realistic construction of litz wire. | en_US |
dc.description.sponsorship | MIT Energy Initiative | en_US |
dc.description.sponsorship | Singapore-MIT Alliance | en_US |
dc.language.iso | en_US | |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1109/APEC.2014.6803390 | en_US |
dc.rights | Creative Commons Attribution-Noncommercial-Share Alike | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/4.0/ | en_US |
dc.source | MIT web domain | en_US |
dc.title | Realistic litz wire characterization using fast numerical simulations | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Zhang, Richard Y., Jacob K. White, John G. Kassakian, and Charles R. Sullivan. “Realistic Litz Wire Characterization Using Fast Numerical Simulations.” 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 (March 2014). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.contributor.mitauthor | Zhang, Richard Y. | en_US |
dc.contributor.mitauthor | White, Jacob K. | en_US |
dc.contributor.mitauthor | Kassakian, John G. | en_US |
dc.relation.journal | Proceedings of the 2014 IEEE Applied Power Electronics Conference and Exposition (APEC 2014) | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dspace.orderedauthors | Zhang, Richard Y.; White, Jacob K.; Kassakian, John G.; Sullivan, Charles R. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0003-1080-4005 | |
dc.identifier.orcid | https://orcid.org/0000-0003-3980-2791 | |
dc.identifier.orcid | https://orcid.org/0000-0002-3443-5702 | |
mit.license | OPEN_ACCESS_POLICY | en_US |
mit.metadata.status | Complete | |