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dc.contributor.authorZhang, Richard Y.
dc.contributor.authorWhite, Jacob K.
dc.contributor.authorKassakian, John G.
dc.contributor.authorSullivan, Charles R.
dc.date.accessioned2014-10-21T16:37:54Z
dc.date.available2014-10-21T16:37:54Z
dc.date.issued2014-03
dc.identifier.isbn978-1-4799-2325-0
dc.identifier.urihttp://hdl.handle.net/1721.1/91048
dc.description.abstractThe losses of realistic litz wires are characterized while explicitly accounting for their construction, using a procedure that computes the current-driven and magnetic-field-driven copper losses using fast numerical simulations. We present a case study that examines loss variation in one- and two-level litz wires as a function of twisting pitch, over a wide range of values and in small increments. Experimental confirmation is presented for predictions made by numerical simulations. Results confirm the capability and efficiency of numerical methods to provide valuable insights into the realistic construction of litz wire.en_US
dc.description.sponsorshipMIT Energy Initiativeen_US
dc.description.sponsorshipSingapore-MIT Allianceen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/APEC.2014.6803390en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleRealistic litz wire characterization using fast numerical simulationsen_US
dc.typeArticleen_US
dc.identifier.citationZhang, Richard Y., Jacob K. White, John G. Kassakian, and Charles R. Sullivan. “Realistic Litz Wire Characterization Using Fast Numerical Simulations.” 2014 IEEE Applied Power Electronics Conference and Exposition - APEC 2014 (March 2014).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorZhang, Richard Y.en_US
dc.contributor.mitauthorWhite, Jacob K.en_US
dc.contributor.mitauthorKassakian, John G.en_US
dc.relation.journalProceedings of the 2014 IEEE Applied Power Electronics Conference and Exposition (APEC 2014)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsZhang, Richard Y.; White, Jacob K.; Kassakian, John G.; Sullivan, Charles R.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1080-4005
dc.identifier.orcidhttps://orcid.org/0000-0003-3980-2791
dc.identifier.orcidhttps://orcid.org/0000-0002-3443-5702
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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