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dc.contributor.authorFaust, Sebastian
dc.contributor.authorRabin, Tal
dc.contributor.authorReyzin, Leonid
dc.contributor.authorTromer, Eran
dc.contributor.authorVaikuntanathan, Vinod
dc.date.accessioned2014-10-23T19:43:56Z
dc.date.available2014-10-23T19:43:56Z
dc.date.issued2014-09
dc.date.submitted2014-04
dc.identifier.issn0097-5397
dc.identifier.issn1095-7111
dc.identifier.urihttp://hdl.handle.net/1721.1/91157
dc.description.abstractPhysical computational devices leak side-channel information that may, and often does, reveal secret internal states. We present a general transformation that compiles any circuit into a circuit with the same functionality but resilience against well-defined classes of leakage. Our construction requires a small, stateless, and computation-independent leak-proof component that draws random elements from a fixed distribution. In essence, we reduce the problem of shielding arbitrarily complex circuits to the problem of shielding a single, simple component. Our approach is based on modeling the adversary as a powerful observer that inspects the device via a limited measurement apparatus. We allow the apparatus to access all the bits of the computation (except those inside the leak-proof component), and the amount of leaked information to grow unbounded over time. However, we assume that the apparatus is limited in the amount of output bits per iteration and the ability to decode certain linear encodings. While our results apply in general to such leakage classes, in particular, we obtain security against (a) constant-depth circuits leakage, where the leakage function is computed by an $\mathsf{AC}^0$ circuit (composed of NOT gates and unbounded fan-in AND and OR gates); (b) noisy leakage, where the leakage function reveals all the bits of the internal state of the circuit, but each bit is perturbed by independent binomial noise---i.e., flipped with some probability $p$. Namely, for some number $p\in(0,1/2]$, each bit of the computation is flipped with probability $p$, and remains unchanged with probability $1-p$.en_US
dc.description.sponsorshipMicrosoft Researchen_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF CyberTrust grant CNS-0808907)en_US
dc.description.sponsorshipUnited States. Air Force Office of Scientific Research (AFRL grant FA8750-08-1-0088)en_US
dc.description.sponsorshipIBM Research (Josef Raviv Postdoctoral Fellowship)en_US
dc.description.sponsorshipEuropean Commission (Marie Curie IEF/FP7 project GAPS, grant 626467)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF grant 0546614)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant NSF grant 0831281)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF grant 1012910)en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (NSF grant 1012798)en_US
dc.language.isoen_US
dc.publisherSociety for Industrial and Applied Mathematicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1137/120880343en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSociety for Industrial and Applied Mathematicsen_US
dc.titleProtecting Circuits from Computationally Bounded and Noisy Leakageen_US
dc.typeArticleen_US
dc.identifier.citationFaust, Sebastian, Tal Rabin, Leonid Reyzin, Eran Tromer, and Vinod Vaikuntanathan. “Protecting Circuits from Computationally Bounded and Noisy Leakage.” SIAM Journal on Computing 43, no. 5 (January 2014): 1564–1614.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.mitauthorVaikuntanathan, Vinoden_US
dc.contributor.mitauthorTromer, Eranen_US
dc.relation.journalSIAM Journal on Computingen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsFaust, Sebastian; Rabin, Tal; Reyzin, Leonid; Tromer, Eran; Vaikuntanathan, Vinoden_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2666-0045
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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