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dc.contributor.authorNaik, Nikhil Deepak
dc.contributor.authorBarsi, Christopher
dc.contributor.authorVelten, Andreas
dc.contributor.authorRaskar, Ramesh
dc.date.accessioned2014-12-23T17:18:17Z
dc.date.available2014-12-23T17:18:17Z
dc.date.issued2013-06
dc.identifier.isbn978-1-55752-972-5
dc.identifier.urihttp://hdl.handle.net/1721.1/92467
dc.description.abstractWe use time-of-flight information in an iterative non-linear optimization algorithm to recover reflectance properties of a three-dimensional scene hidden behind a diffuser. We demonstrate reconstruction of wide-field images without relying on diffuser correlation properties.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1364/CLEO_SI.2013.CTu1H.3en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceMIT web domainen_US
dc.titleTime-resolved reconstruction of scene reflectance hidden by a diffuseren_US
dc.typeArticleen_US
dc.identifier.citationNaik, Nikhil, Christopher Barsi, Andreas Velten, and Ramesh Raskar. “Time-Resolved Reconstruction of Scene Reflectance Hidden by a Diffuser.” CLEO: 2013 (2013), 9-14 June 2013, San Jose, CA.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Media Laboratoryen_US
dc.contributor.departmentProgram in Media Arts and Sciences (Massachusetts Institute of Technology)en_US
dc.contributor.mitauthorNaik, Nikhil Deepaken_US
dc.contributor.mitauthorBarsi, Christopheren_US
dc.contributor.mitauthorVelten, Andreasen_US
dc.contributor.mitauthorRaskar, Rameshen_US
dc.relation.journal2013 Conference on Lasers and Electro-Optics, CLEO 2013en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsNaik, Nikhil; Barsi, Christopher; Velten, Andreas; Raskar, Rameshen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-9894-8865
dc.identifier.orcidhttps://orcid.org/0000-0002-3254-3224
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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