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dc.contributor.authorYang, Wei
dc.contributor.authorDurisi, Giuseppe
dc.contributor.authorKoch, Tobias
dc.contributor.authorPolyanskiy, Yury
dc.date.accessioned2015-02-04T21:17:57Z
dc.date.available2015-02-04T21:17:57Z
dc.date.issued2013-08
dc.identifier.isbn9783800735297
dc.identifier.isbn3800735296
dc.identifier.urihttp://hdl.handle.net/1721.1/93766
dc.description.abstractThis tutorial paper deals with the problem of characterizing the maximal achievable rate R(n; ϵ )at a given blocklength n and error probability ϵ over block-fading channels. We review recent results that establish tight bounds on R(n; ϵ )and characterize its asymptotic behavior. Comparison between the theoretical results and the data rates achievable with the coding scheme used in LTE-Advanced are reported.en_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6629767en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Polyanskiyen_US
dc.titleBlock-fading channels at finite blocklengthen_US
dc.typeArticleen_US
dc.identifier.citationYang, Wei, Giuseppe Durisi, Tobias Koch, and Yury Polyanskiy. "Block-fading channels at finite blocklength." in the Tenth International Symposium on Wireless Communication Systems (ISWCS 2013), Ilmenau, Germany, August 27-30, 2013. 1-4 p.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.approverPolyanskiy, Yuryen_US
dc.contributor.mitauthorPolyanskiy, Yuryen_US
dc.relation.journalProceedings of the Tenth International Symposium on Wireless Communication Systems, (ISWCS 2013)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsYang, Wei; Durisi, Giuseppe; Koch, Tobias; Polyanskiy, Yuryen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-2109-0979
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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