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dc.contributor.authorKashinath, A.
dc.contributor.authorWang, P.
dc.contributor.authorMajewski, J.
dc.contributor.authorBaldwin, J. Kevin
dc.contributor.authorWang, Y. Q.
dc.contributor.authorDemkowicz, Michael J.
dc.date.accessioned2015-02-11T20:08:06Z
dc.date.available2015-02-11T20:08:06Z
dc.date.issued2013-05
dc.date.submitted2013-07
dc.identifier.issn00218979
dc.identifier.issn1089-7550
dc.identifier.urihttp://hdl.handle.net/1721.1/94339
dc.description.abstractWe use neutron reflectometry to find the critical helium (He) fluence required to form He bubbles at interfaces between fcc and bcc metals. Our findings are in agreement with previous experimental as well as modeling results and provide evidence for the presence of stable He platelets at fcc-bcc interfaces prior to bubble formation. The stable storage of He in interfacial platelets may provide the basis for the design of materials with increased resistance to He-induced degradation.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Basic Energy Sciences (Center for Materials in Irradiation and Mechanical Extremes. Award 2008LANL 1026)en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Basic Energy Sciences (Los Alamos National Laboratory. Contract DE-AC52-06NA25396)en_US
dc.language.isoen_US
dc.publisherAmerican Institute of Physics (AIP)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.4813780en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceProf. Demkowicz via Angie Locknaren_US
dc.titleDetection of helium bubble formation at fcc-bcc interfaces using neutron reflectometryen_US
dc.typeArticleen_US
dc.identifier.citationKashinath, A., P. Wang, J. Majewski, J. K. Baldwin, Y. Q. Wang, and M. J. Demkowicz. “Detection of Helium Bubble Formation at Fcc-Bcc Interfaces Using Neutron Reflectometry.” Journal of Applied Physics 114, no. 4 (2013): 043505. © 2013 AIP Publishing LLCen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.approverDemkowicz, Michael J.en_US
dc.contributor.mitauthorDemkowicz, Michael J.en_US
dc.contributor.mitauthorKashinath, A.en_US
dc.relation.journalJournal of Applied Physicsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsKashinath, A.; Wang, P.; Majewski, J.; Baldwin, J. K.; Wang, Y. Q.; Demkowicz, M. J.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-3949-0441
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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