| dc.contributor.author | Demkowicz, Michael J. | |
| dc.contributor.author | Skirlo, Scott A. | |
| dc.date.accessioned | 2015-02-12T20:54:59Z | |
| dc.date.available | 2015-02-12T20:54:59Z | |
| dc.date.issued | 2013-10 | |
| dc.date.submitted | 2013-08 | |
| dc.identifier.issn | 00036951 | |
| dc.identifier.issn | 1077-3118 | |
| dc.identifier.uri | http://hdl.handle.net/1721.1/94519 | |
| dc.description.abstract | Using molecular dynamics modeling, we show that interfaces in sputter deposited Cu-Nb superlattices exhibit time-dependent elasticity, i.e., viscoelasticity, under shear loading. In the high temperature and small strain rate limit, the interfacial shear modulus approaches a value proportional to the density of steps in the interface. It may therefore be possible to tailor the low-frequency shear moduli of interfaces by controlling their step densities. | en_US |
| dc.description.sponsorship | National Science Foundation (U.S.) (Grant 1150862) | en_US |
| dc.description.sponsorship | MIT International Science and Technology Initiatives (MISTI-Chile Seed Grant) | en_US |
| dc.description.sponsorship | MIT Energy Initiative (Summer Fellowship) | en_US |
| dc.language.iso | en_US | |
| dc.publisher | American Institute of Physics (AIP) | en_US |
| dc.relation.isversionof | http://dx.doi.org/10.1063/1.4827103 | en_US |
| dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
| dc.source | Prof. Demkowicz via Angie Locknar | en_US |
| dc.title | Viscoelasticity of stepped interfaces | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Skirlo, S. A., and M. J. Demkowicz. “Viscoelasticity of Stepped Interfaces.” Appl. Phys. Lett. 103, no. 17 (2013): 171908. © 2013 AIP Publishing LLC | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Physics | en_US |
| dc.contributor.approver | Demkowicz, Michael J. | en_US |
| dc.contributor.mitauthor | Demkowicz, Michael J. | en_US |
| dc.contributor.mitauthor | Skirlo, Scott A. | en_US |
| dc.relation.journal | Applied Physics Letters | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
| eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
| dspace.orderedauthors | Skirlo, S. A.; Demkowicz, M. J. | en_US |
| dc.identifier.orcid | https://orcid.org/0000-0003-3438-7234 | |
| dc.identifier.orcid | https://orcid.org/0000-0003-3949-0441 | |
| mit.license | PUBLISHER_POLICY | en_US |
| mit.metadata.status | Complete | |
