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dc.contributor.authorYip, Marcus
dc.contributor.authorChandrakasan, Anantha P.
dc.date.accessioned2015-02-24T19:55:49Z
dc.date.available2015-02-24T19:55:49Z
dc.date.issued2013-04
dc.date.submitted2012-12
dc.identifier.issn0018-9200
dc.identifier.issn1558-173X
dc.identifier.urihttp://hdl.handle.net/1721.1/95486
dc.description.abstractA power-scalable SAR ADC for sensor applications is presented. The ADC features a reconfigurable 5-to-10-bit DAC whose power scales exponentially with resolution. At low resolutions where noise and linearity requirements are reduced, supply voltage scaling is leveraged to further reduce the energy-per-conversion. The ADC operates up to 2 MS/s at 1 V and 5 kS/s at 0.4 V, and its power scales linearly with sample rate down to leakage levels of 53 nW at 1 V and 4 nW at 0.4 V. Leakage power-gating during a SLEEP mode in between conversions reduces total power by up to 14% at sample rates below 1 kS/s. Prototyped in a low-power 65 nm CMOS process, the ADC in 10-bit mode achieves an INL and DNL of 0.57 LSB and 0.58 LSB respectively at 0.6 V, and the Nyquist SNDR and SFDR are 55 dB and 69 dB respectively at 0.55 V and 20 kS/s. The ADC achieves an optimal FOM of 22.4 fJ/conversion-step at 0.55 V in 10-bit mode. The combined techniques of DAC resolution and voltage scaling maximize efficiency at low resolutions, resulting in an FOM that increases by only 7x over the 5-bit scaling range, improving upon a 32x degradation that would otherwise arise from truncation of bits from an ADC of fixed resolution and voltage.en_US
dc.description.sponsorshipUnited States. Defense Advanced Research Projects Agencyen_US
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaen_US
dc.language.isoen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/JSSC.2013.2254551en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceChandrakasanen_US
dc.titleA Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applicationsen_US
dc.typeArticleen_US
dc.identifier.citationYip, Marcus, and A. P. Chandrakasan. “A Resolution-Reconfigurable 5-to-10-Bit 0.4-to-1 V Power Scalable SAR ADC for Sensor Applications.” IEEE Journal of Solid-State Circuits 48, no. 6 (June 2013): 1453–1464.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Microsystems Technology Laboratoriesen_US
dc.contributor.approverChandrakasan, Anantha P.en_US
dc.contributor.mitauthorYip, Marcusen_US
dc.contributor.mitauthorChandrakasan, Anantha P.en_US
dc.relation.journalIEEE Journal of Solid-State Circuitsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsYip, Marcus; Chandrakasan, A. P.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-5977-2748
mit.licenseOPEN_ACCESS_POLICYen_US
mit.metadata.statusComplete


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