Show simple item record

dc.contributor.authorSivarajah, Prasahnt
dc.contributor.authorTeo, Stephanie M.
dc.contributor.authorWerley, Christopher A.
dc.contributor.authorNelson, Keith Adam
dc.contributor.authorOfori-Okai, Benjamin Kwasi
dc.date.accessioned2015-02-25T16:46:12Z
dc.date.available2015-02-25T16:46:12Z
dc.date.issued2014-09
dc.date.submitted2014-08
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/1721.1/95526
dc.description.abstractIn recent years it has become possible to generate terahertz-frequency (THz) fields that are strong enough to induce nonlinear responses in ordinary molecules and materials. Part of the development of THz technology and nonlinear spectroscopy has relied on optical imaging of THz field profiles and their time and position-dependent evolution. A THz "polaritonics" platform enables extensive control over THz fields that are generated; integration of functional elements such as bandgap structures and metamaterial devices; optical imaging of the THz near and far fields with subcycle temporal and subwavelength spatial resolution; and exploitation of the results for nonlinear spectroscopy.en_US
dc.description.sponsorshipNational Science Foundation (U.S.) (Grant 1128632)en_US
dc.description.sponsorshipNational Science Foundation (U.S.). Graduate Research Fellowship Programen_US
dc.language.isoen_US
dc.publisherSPIEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1117/12.2063350en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceSPIEen_US
dc.titleImaging of terahertz fields and responsesen_US
dc.typeArticleen_US
dc.identifier.citationOfori-Okai, Benjamin K., Prasahnt Sivarajah, Stephanie M. Teo, Christopher A. Werley, and Keith A. Nelson. “Imaging of Terahertz Fields and Responses.” Edited by Zhiwen Liu. Ultrafast Nonlinear Imaging and Spectroscopy II (September 5, 2014). © 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.mitauthorNelson, Keith Adamen_US
dc.contributor.mitauthorOfori-Okai, Benjamin Kwasien_US
dc.contributor.mitauthorSivarajah, Prasahnten_US
dc.contributor.mitauthorTeo, Stephanie M.en_US
dc.relation.journalProceedings of SPIE--the International Society for Optical Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsOfori-Okai, Benjamin K.; Sivarajah, Prasahnt; Teo, Stephanie M.; Werley, Christopher A.; Nelson, Keith A.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-0737-6786
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
dc.identifier.orcidhttps://orcid.org/0000-0002-6762-7313
dc.identifier.orcidhttps://orcid.org/0000-0002-1603-4067
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record