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First Direct Limits on Lightly Ionizing Particles with Electric Charge Less than e/6

dc.contributor.authorAgnese, R.
dc.contributor.authorBalakishiyeva, D.
dc.contributor.authorBasu Thakur, R.
dc.contributor.authorBauer, D. A.
dc.contributor.authorBillard, Julien
dc.contributor.authorBorgland, A.
dc.contributor.authorBowles, M. A.
dc.contributor.authorBrandt, D.
dc.contributor.authorBrink, P. L.
dc.contributor.authorBunker, R.
dc.contributor.authorCabrera, B.
dc.contributor.authorCaldwell, D. O.
dc.contributor.authorCerdeno, D. G.
dc.contributor.authorChagani, H.
dc.contributor.authorChen, Y.
dc.contributor.authorCooley, J.
dc.contributor.authorCornell, B.
dc.contributor.authorCrewdson, C. H.
dc.contributor.authorCushman, P.
dc.contributor.authorDaal, M.
dc.contributor.authorDi Stefano, P. C. F.
dc.contributor.authorDoughty, T.
dc.contributor.authorEsteban, L.
dc.contributor.authorFallows, S.
dc.contributor.authorGodfrey, G. L.
dc.contributor.authorGolwala, S. R.
dc.contributor.authorHall, J.
dc.contributor.authorHarris, H. R.
dc.contributor.authorHertel, Scott Alexander
dc.contributor.authorHofer, T.
dc.contributor.authorHolmgren, D.
dc.contributor.authorHsu, L.
dc.contributor.authorHuber, M. E.
dc.contributor.authorJastram, A.
dc.contributor.authorKamaev, O.
dc.contributor.authorKara, B.
dc.contributor.authorKelsey, M. H.
dc.contributor.authorKennedy, A.
dc.contributor.authorKiveni, M.
dc.contributor.authorKoch, K.
dc.contributor.authorLoer, B.
dc.contributor.authorLopez Asamar, E.
dc.contributor.authorMahapatra, R.
dc.contributor.authorMandic, V.
dc.contributor.authorMartinez, C.
dc.contributor.authorMcCarthy, Kevin Ahmad
dc.contributor.authorMirabolfathi, N.
dc.contributor.authorMoffatt, R. A.
dc.contributor.authorMoore, D. C.
dc.contributor.authorNelson, H.
dc.contributor.authorNelson, R. H.
dc.contributor.authorOgburn, R. W.
dc.contributor.authorPage, K.
dc.contributor.authorPage, W. A.
dc.contributor.authorPartridge, R.
dc.contributor.authorPepin, M.
dc.contributor.authorPhipps, A.
dc.contributor.authorPrasad, K.
dc.contributor.authorPyle, M.
dc.contributor.authorQiu, H.
dc.contributor.authorRau, W.
dc.contributor.authorRedl, P.
dc.contributor.authorReisetter, A.
dc.contributor.authorRicci, Y.
dc.contributor.authorRogers, H. E.
dc.contributor.authorSaab, T.
dc.contributor.authorSadoulet, B.
dc.contributor.authorSander, J.
dc.contributor.authorSchneck, K.
dc.contributor.authorSchnee, R. W.
dc.contributor.authorScorza, S.
dc.contributor.authorSerfass, B.
dc.contributor.authorShank, B.
dc.contributor.authorSpeller, D.
dc.contributor.authorUpadhyayula, S.
dc.contributor.authorVillano, A. N.
dc.contributor.authorWelliver, B.
dc.contributor.authorWright, D. H.
dc.contributor.authorYellin, S.
dc.contributor.authorYen, J. J.
dc.contributor.authorYoung, B. A.
dc.contributor.authorZhang, J.
dc.contributor.authorAnderson, Adam Jonathan
dc.contributor.authorFigueroa-Feliciano, Enectali
dc.contributor.authorLeder, Alexander Friedrich
dc.date.accessioned2015-03-27T16:55:35Z
dc.date.available2015-03-27T16:55:35Z
dc.date.issued2015-03
dc.date.submitted2015-02
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/96220
dc.description.abstractWhile the standard model of particle physics does not include free particles with fractional charge, experimental searches have not ruled out their existence. We report results from the Cryogenic Dark Matter Search (CDMS II) experiment that give the first direct-detection limits for cosmogenically produced relativistic particles with electric charge lower than e/6. A search for tracks in the six stacked detectors of each of two of the CDMS II towers finds no candidates, thereby excluding new parameter space for particles with electric charges between e/6 and e/200.en_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNatural Sciences and Engineering Research Council of Canadaen_US
dc.description.sponsorshipSpain. Ministerio de Economia y Competividad (MultiDark)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.114.111302en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleFirst Direct Limits on Lightly Ionizing Particles with Electric Charge Less than e/6en_US
dc.typeArticleen_US
dc.identifier.citationAgnese, R., et al. "First Direct Limits on Lightly Ionizing Particles with Electric Charge Less than e/6." Phys. Rev. Lett. 114, 111302 (March 2015). © 2015 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorAnderson, Adam Jonathanen_US
dc.contributor.mitauthorBillard, Julienen_US
dc.contributor.mitauthorFigueroa-Feliciano, Enectalien_US
dc.contributor.mitauthorHertel, Scott Alexanderen_US
dc.contributor.mitauthorLeder, Alexander Friedrichen_US
dc.contributor.mitauthorMcCarthy, Kevin Ahmaden_US
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2015-03-18T22:00:03Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsAgnese, R.; Anderson, A. J.; Balakishiyeva, D.; Basu Thakur, R.; Bauer, D. A.; Billard, J.; Borgland, A.; Bowles, M. A.; Brandt, D.; Brink, P. L.; Bunker, R.; Cabrera, B.; Caldwell, D. O.; Cerdeno, D. G.; Chagani, H.; Chen, Y.; Cooley, J.; Cornell, B.; Crewdson, C. H.; Cushman, P.; Daal, M.; Di Stefano, P. C. F.; Doughty, T.; Esteban, L.; Fallows, S.; Figueroa-Feliciano, E.; Godfrey, G. L.; Golwala, S. R.; Hall, J.; Harris, H. R.; Hertel, S. A.; Hofer, T.; Holmgren, D.; Hsu, L.; Huber, M. E.; Jastram, A.; Kamaev, O.; Kara, B.; Kelsey, M. H.; Kennedy, A.; Kiveni, M.; Koch, K.; Leder, A.; Loer, B.; Lopez Asamar, E.; Mahapatra, R.; Mandic, V.; Martinez, C.; McCarthy, K. A.; Mirabolfathi, N.; Moffatt, R. A.; Moore, D. C.; Nelson, H.; Nelson, R. H.; Ogburn, R. W.; Page, K.; Page, W. A.; Partridge, R.; Pepin, M.; Phipps, A.; Prasad, K.; Pyle, M.; Qiu, H.; Rau, W.; Redl, P.; Reisetter, A.; Ricci, Y.; Rogers, H. E.; Saab, T.; Sadoulet, B.; Sander, J.; Schneck, K.; Schnee, R. W.; Scorza, S.; Serfass, B.; Shank, B.; Speller, D.; Upadhyayula, S.; Villano, A. N.; Welliver, B.; Wright, D. H.; Yellin, S.; Yen, J. J.; Young, B. A.; Zhang, J.en_US
dc.identifier.orcidhttps://orcid.org/0000-0003-1429-1104
dc.identifier.orcidhttps://orcid.org/0000-0002-4435-4623
dc.identifier.orcidhttps://orcid.org/0000-0001-9285-5556
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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