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dc.contributor.authorCuffe, John
dc.contributor.authorCollins, Kimberlee C.
dc.contributor.authorShchepetov, Andrey
dc.contributor.authorPrunnila, Mika
dc.contributor.authorAhopelto, Jouni
dc.contributor.authorSotomayor Torres, Clivia M.
dc.contributor.authorChen, Gang
dc.contributor.authorEliason, Jeffrey Kristian
dc.contributor.authorMaznev, Alexei
dc.contributor.authorJohnson, Jeremiah A.
dc.contributor.authorNelson, Keith Adam
dc.date.accessioned2015-06-18T13:40:48Z
dc.date.available2015-06-18T13:40:48Z
dc.date.issued2015-06
dc.date.submitted2014-08
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/97463
dc.description.abstractKnowledge of the mean-free-path distribution of heat-carrying phonons is key to understanding phonon-mediated thermal transport. We demonstrate that thermal conductivity measurements of thin membranes spanning a wide thickness range can be used to characterize how bulk thermal conductivity is distributed over phonon mean free paths. A noncontact transient thermal grating technique was used to measure the thermal conductivity of suspended Si membranes ranging from 15–1500 nm in thickness. A decrease in the thermal conductivity from 74–13% of the bulk value is observed over this thickness range, which is attributed to diffuse phonon boundary scattering. Due to the well-defined relation between the membrane thickness and phonon mean-free-path suppression, combined with the range and accuracy of the measurements, we can reconstruct the bulk thermal conductivity accumulation vs. phonon mean free path, and compare with theoretical models.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Science (Solid-State Solar-Thermal Energy Conversion Center Grant DE-SC0001299/DE-FG02-09ER46577)en_US
dc.description.sponsorshipAcademy of Finland (Grant 252598)en_US
dc.description.sponsorshipSeventh Framework Programme (European Commission) (ENERGY FET Project MERGING Grant 309150)en_US
dc.description.sponsorshipSpanish Plan Nacional project TAPHOR (MAT-2012-31392)en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.91.245423en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleReconstructing phonon mean-free-path contributions to thermal conductivity using nanoscale membranesen_US
dc.typeArticleen_US
dc.identifier.citationCuffe, John, Jeffrey K. Eliason, A. A. Maznev, Kimberlee C. Collins, Jeremy A. Johnson, Andrey Shchepetov, Mika Prunnila, et al. “Reconstructing Phonon Mean-Free-Path Contributions to Thermal Conductivity Using Nanoscale Membranes.” Phys. Rev. B 91, no. 24 (June 2015). © 2015 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineeringen_US
dc.contributor.mitauthorCuffe, Johnen_US
dc.contributor.mitauthorEliason, Jeffrey Kristianen_US
dc.contributor.mitauthorMaznev, Alexeien_US
dc.contributor.mitauthorCollins, Kimberlee C.en_US
dc.contributor.mitauthorJohnson, Jeremiah A.en_US
dc.contributor.mitauthorChen, Gangen_US
dc.contributor.mitauthorNelson, Keith Adamen_US
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2015-06-17T22:00:03Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsCuffe, John; Eliason, Jeffrey K.; Maznev, A. A.; Collins, Kimberlee C.; Johnson, Jeremy A.; Shchepetov, Andrey; Prunnila, Mika; Ahopelto, Jouni; Sotomayor Torres, Clivia M.; Chen, Gang; Nelson, Keith A.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3968-8530
dc.identifier.orcidhttps://orcid.org/0000-0001-7804-5418
dc.identifier.orcidhttps://orcid.org/0000-0001-9157-6491
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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