Omnidirectional wavelength selective emitters/absorbers based on dielectric-filled anti-reflection coated two-dimensional metallic photonic crystals
Author(s)
Yeng, Yi Xiang; Chou, Jeffrey Brian; Rinnerbauer, Veronika; Shen, Yichen; Kim, Sang-Gook; Joannopoulos, John D.; Soljacic, Marin; Celanovic, Ivan; ... Show more Show less
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We demonstrate designs of dielectric-filled anti-reflection coated (ARC) two-dimensional (2D) metallic photonic crystals (MPhCs) capable of omnidirectional, polarization insensitive, wavelength selective emission/absorption. Up to 26% improvement in hemispherically averaged emittance/absorptance below the cutoff wavelength is observed for optimized hafnium oxide filled 2D tantalum (Ta) PhCs over the unfilled 2D Ta PhCs. The optimized designs possess high hemispherically averaged emittance/absorptance of 0.86 at wavelengths below the cutoff wavelength and low hemispherically averaged emittance/absorptance of 0.12 at wavelengths above the cutoff wavelength, which is extremely promising for applications such as thermophotovoltaic energy conversion, solar absorption, and infrared spectroscopy.
Date issued
2014-08Department
Massachusetts Institute of Technology. Institute for Soldier Nanotechnologies; Lincoln Laboratory; Massachusetts Institute of Technology. Department of Mechanical Engineering; Massachusetts Institute of Technology. Department of Physics; Massachusetts Institute of Technology. Research Laboratory of ElectronicsJournal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Yeng, Yi Xiang, Jeffrey B. Chou, Veronika Rinnerbauer, Yichen Shen, Sang-Gook Kim, John D. Joannopoulos, Marin Soljacic, and Ivan Celanovic. “Omnidirectional Wavelength Selective Emitters/absorbers Based on Dielectric-Filled Anti-Reflection Coated Two-Dimensional Metallic Photonic Crystals.” Edited by Eva M. Campo, Elizabeth A. Dobisz, and Louay A. Eldada. Nanoengineering: Fabrication, Properties, Optics, and Devices XI (August 28, 2014). © 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Version: Final published version
ISSN
0277-786X