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Inverse order-disorder transition of charge stripes

dc.contributor.authorLee, Shu-Han
dc.contributor.authorLai, Yen-Chung
dc.contributor.authorDu, Chao-Hung
dc.contributor.authorSiegenfeld, Alexander F.
dc.contributor.authorKao, Ying-Jer
dc.contributor.authorHatton, Peter D.
dc.contributor.authorPrabhakaran, D.
dc.contributor.authorSu, Yixi
dc.contributor.authorHuang, Di-Jing
dc.date.accessioned2015-11-10T18:06:00Z
dc.date.available2015-11-10T18:06:00Z
dc.date.issued2015-11
dc.date.submitted2015-02
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.urihttp://hdl.handle.net/1721.1/99888
dc.description.abstractWe report an unusual transition behavior of charge stripes in La[subscript 1.67]Sr[subscript 0.33]NiO[subscript 4] using x-ray scattering. The segregated holes in La[subscript 1.67]Sr[subscript 0.33]NiO[subscript 4] are observed to form anisotropic stripes in the a × b plane of the crystal space below the transition temperature T ≃ 238 K, and at the same time, display an unusual inverse order-disorder transition along the c axis. Using a phenomenological Landau theory, we show that this inverse transition is due to the interlayer coupling between the charge and spin orders. This discovery points to the importance of the interlayer correlations in the strongly correlated electrons system.en_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevB.92.205114en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAmerican Physical Societyen_US
dc.titleInverse order-disorder transition of charge stripesen_US
dc.typeArticleen_US
dc.identifier.citationLee, Shu-Han, Yen-Chung Lai, Chao-Hung Du, Alexander F. Siegenfeld, Ying-Jer Kao, Peter D. Hatton, D. Prabhakaran, Yixi Su, and Di-Jing Huang. “Inverse Order-Disorder Transition of Charge Stripes.” Physical Review B 92, no. 20 (November 2015). © 2015 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorSiegenfeld, Alexander F.en_US
dc.relation.journalPhysical Review Ben_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2015-11-09T20:04:28Z
dc.language.rfc3066en
dc.rights.holderAmerican Physical Society
dspace.orderedauthorsLee, Shu-Han; Lai, Yen-Chung; Du, Chao-Hung; Siegenfeld, Alexander F.; Kao, Ying-Jer; Hatton, Peter D.; Prabhakaran, D.; Su, Yixi; Huang, Di-Jingen_US
mit.licensePUBLISHER_POLICYen_US
mit.metadata.statusComplete


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